ICMCTF2011 Session F2-1: High Power Impulse Magnetron Sputtering
Time Period ThA Sessions | Abstract Timeline | Topic F Sessions | Time Periods | Topics | ICMCTF2011 Schedule
Start | Invited? | Item |
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1:30 PM | Invited |
F2-1-1 High Power Pulsed Magnetron Sputtering: a Review of Magnetron Ion Sputtering
Jones Alami (Sulzer Metaplas, Germany); Kostas Sarakinos (Linköping University, Sweden); Stephanos Konstantinidis (CIRMAP, University of Mons, Belgium) A main parts of a typical sputtering apparatus are a power supply, a sputter target sitting inside a vacuum chamber, a substrate powered by a bias power supply. Understanding of each of the consisting parts limitations and capabilities is of high importance to the coating developer, which is even more the case when HPPMS technology is used. HPPMS and HIPIMS are acronyms of an emerging sputtering technology that has gained substantial interest among academics and industrials alike. HPPMS (HIPIMS) which stands for high power (im)pulsed magnetron sputtering is a physical vapor deposition technique in which the power is applied to the target in low-duty-cycle pulses (< 10%) and low frequency (< 10 kHz). As a result, pulsed target power densities of several kW cm− 2 are obtained. The HPPMS mode of operation results in generation of a large number of charged particles in the plasma, including electrons, ions, and multi-fold charged ions. The dynamics of such plasma have been especially studied with regards to the high ionization degree of the sputtered atoms, their charge, and their transport route as they are expanding away from the sputter-target. A number of studies have utilized the abnormal plasma dynamics observed in the HPPMS plasma in order to grow dense and smooth coatings on flat and complex-shaped substrates. They found that HPPMS provides new and parameters to control the deposition process, tailor the properties and optimize the performance of elemental and compound films. In the present review paper, an attempt is made at demonstrating the main features of HPPMS by trying to find the red-line through the more-than-250 publications on the subject. In order to do this, the power supply types in the market are reviewed. This is followed by a short description of the type of magnetrons needed for the HPPMS operation. Finally, examples of coatings deposited by HPPMS are given and the benefits of using this technique are highlighted. |
2:10 PM |
F2-1-3 A Two-Zone Model for High-Power Pulsed Magnetron Sputtering Discharges
Tomas Kozak, AndreaDagmar Pajdarova (University of West Bohemia, Czech Republic) We present a two-zone non-stationary model of a high-power pulsed magnetron sputtering discharge. The model splits the magnetron discharge into two zones, namely the high density plasma ring above the target racetrack including a target sheath and the bulk plasma region between the plasma ring and the substrate. By solving the particle and energy conservation equations for these two zones, the model makes it possible to evaluate time evolutions of the averaged process gas and target material neutral and ion densities, as well as the fluxes of these particles to the target and substrate during a pulse period. Consequently, the target and substrate current density waveforms, together with the effective electron temperature, can be calculated. In addition, the important deposition characteristics, such as the deposition rate, the fraction of target material ions in the total ion flux to the substrate and the ionized fraction of target material atoms in the flux to the substrate can be evaluated. The geometric input parameters of the model are the vacuum chamber dimensions, the target-to-substrate distance, the target and substrate diameters and the plasma ring size (defined roughly by the geometry of the magnetic field). The main process input parameters are the process gas pressure, the magnetic field strength, the target voltage waveform during a pulse period and the repetition frequency of the pulses. Furthermore, additional material parameters, such as the sputtering yields, the secondary electron emission coefficients, the ionization and excitation cross-sections for the process gas and target material must be provided. The effects of various process parameters on the discharge and deposition characteristics were examined. The model predictions were compared with the experimental results obtained for two different high-power pulsed magnetron systems.1,2 It was shown that the model provides a good qualitative picture of the complicated processes determining the sputtering and deposition mechanisms in the high-power pulsed magnetron discharges investigated. 1A.D. Pajdarova, J. Vlcek, P. Kudlacek and J. Lukas: Electron energy distributions and plasma parameters in high-power pulsed magnetron sputtering discharges, Plasma Sources Sci. Technol. 18, 025008 (2009).2A. Anders, J. Andersson and A. Ehiasarian: High power impulse magnetron sputtering: Current-voltage-time characteristics indicate the onset of sustained self-sputtering, J. Appl. Phys. 102, 113303 (2007); Erratum: J. Appl. Phys. 103, 039901 (2008). |
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2:30 PM |
F2-1-4 Temporal Evolution of the Radial Plasma Emission Profile in HIPIMS Plasma Discharge
Ante Hecimovic, Teresa de los Arcos, Marc Böke, Jörg Winter (Institute for Experimental Physics II, Ruhr-Universität Bochum, Germany) High power impulse magnetron sputtering (HIPIMS) is a plasma vapour deposition technique used for deposition of dense coatings. HIPIMS utilizes short pulses of high power delivered to the target in order to generate a high amount of metal ions. Ion densities are two orders of magnitude higher compared to DC magnetron sputtering with the same average power. The dynamic of the plasma generation and the transport of metal particles during and after the pulse have not been fully understood. In order to contribute to better understanding of the dynamics of the HIPIMS plasma discharge time and wavelength resolved measurements of the light emitted from the plasma have been performed. Sideway photos of the HIPIMS plasma have been recorded using Charge Coupled Device (CCD) camera with gate width of 5 μs. For each photo Abel inversion has been performed to compute the radial emission profile of the plasma. Bandpass interference filters were used to isolate desired wavelength in order to observe lines of Ti0, Ti1+, Ar0 and Ar1+ particles in HIPIMS plasma discharge with Titanium (Ti) target in Ar atmosphere. Result is the temporal evolution of radial emission profile of both metal and gas atoms and singly charged ions. Work funded by Deutsche Forschungsgemeinschaft (DFG) within SFB-TR 87 project. |
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2:50 PM |
F2-1-5 The Influence of Pulse Arrangement and Off-Time Between Positive and Negative Pulse in Bipolar HIPIMS
Ralf Bandorf, Maik Reschke, Holger Gerdes, Günter Bräuer (Fraunhofer IST, Germany) Besides conventional unipolar high power impulse sputtering (HIPIMS) the bipolar mode is offering additional degrees of freedom, especially in case of reactive sputtering. For oxides improvement of process stability and coating quality is reported using bipolar mode instead of unipolar. In this paper we investigated the influence of the used pulse arrangement on the resuting voltage-current response at the target, as well as the plasma and the film properties. For basic investigation pure titanium without additional oxygen was investigated. The pulse on-time for positive and negative pulse were kept constant. The off-time between the positive and negative pulse was varied. From a symmetric arrangement of defined pulse and pause for positive and negative pulse the off-time separating positive and negative pulse was shortened to a minimum pause of 20μs. From nearly no influence the peak current was modified and got unsymmetric when bringing positive and negative pulse close together. The remaining ions form the positive pulse led to faster ignition of the negative pulse. The correlated OES spectra, deposition rates, and film structure is investigated. |
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3:10 PM |
F2-1-6 A Study on the Deposition Rate of Modulated Pulse Power (MPP) Magnetron Sputtering of Metallic Thin Films
Jianliang Lin, John Moore (Colorado School of Mines); William Sproul (USA Reactive Sputtering, INC) As a variation of high power pulsed magnetron sputtering technique, modulated pulse power (MPP) magnetron sputtering has shown the possibility to achieve a high deposition rate and a high degree of ionization of the sputtered material at the same time. In this study, we have investigated the influence of themagnetic field strength on the deposition rate of different metal films (Cr, Ti, Al, Cu, etc,) and plasma properties using the MPP technique in a closed field unbalanced magnetron sputtering system. The MPP deposition rates have been compared to those obtained from the films deposited by direct current magnetron sputtering (DCMS) under the same experimental conditions. The time averaged ion energy and mass distributions of the positive ions at different magnetic field strength s were compared using an electrostatic quadrupole plasma mass spectrometer. The effects of the repetition rate, peak target current (power) and pulse length on the MPP deposition rate have also been investigated. It was found that both DCMS and MPP depositions showed an increase in the deposition rates as the magnetic field strength decreased under the same experimental conditions. The MPP deposition rate can generally achieve more than 70-80% of the DCMS rate for different metal film depositions. In many cases, the MPP deposition rate exceeded the DCMS rate in the right power, magnetic field strength and pulsing conditions . The magnetic field strength also showed a strong effect on the ion energy and mass distributions . Additionally, the microstructure and mechanical properties of the films deposited at different magnetron field strength will also be reported. |
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3:30 PM |
F2-1-7 The Effect of Various Deposition Parameters on the Phase of Tantalum Thick Films Deposited by Modulated Pulse Power Magnetron Sputtering
Sterling Myers, Jianliang Lin, John Moore (Colorado School of Mines); William Sproul (Reactive Sputtering, Inc.); Sabrina Lee (US Army ARDEC Benet Labs) Tantalum thin films exhibit two crystalline phases, α (body-centered-cubic) and β (metastable tetragonal). α is the phase commonly found in bulk tantalum, which exhibits good ductility, high melting temperature, and low resistivity. β, however, has high resistivity, high hardness, yet is very brittle. Thus, α is typically preferred for wear and corrosion resistant applications. In this study, modulated pulse power (MPP) magnetron sputtering was used to deposit thin and thick tantalum coatings to determine the effect of several deposition parameters, such as target power (1-3 kW), working pressure (3 – 10 mTorr), substrate-to-target distance (60 – 165 mm), and negative substrate bias (0 – -150 V) on the phase control without substrate heating and post annealing process. The phase, microstructure, and mechanical properties of the coatings were characterized using X-ray diffraction, scanning electron microscopy, micro scratch test and nanoindentation. |
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3:50 PM |
F2-1-8 Control of the Magnetic Field for HiPIMS Process Optimization
J. Capek, M. Hala, O. Zabeida, Jolanta Klemberg-Sapieha, Ludvik Martinu (Ecole Polytechnique de Montreal, Canada) Deposition of coatings from highly ionized metal plasma makes HiPIMS a very attractive PVD technique. However, discharge operation in the metal-dominated HiPIMS mode and process stability is frequently affected by a combination of the magnetron configuration (size and magnetic field) and by the target conditions (e.g. material and thickness). In addition, target erosion is an important issue significantly affecting process reproducibility. In the present work, we propose to stabilize the HiPIMS discharge by controlling the target magnetic field using metal spacers with different thicknesses in between the magnetron surface and the target. We demonstrate a straightforward discharge optimization and enhanced reproducibility, while using various metal target materials (such as Nb, Ta or Ti, and even semiconducting Si), and different levels of target erosion. We show the effect of such an approach on the magnetic field in front of the target, and on its consequences on the deposition rate, the coating properties, and the overall process optimization. |
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4:10 PM |
F2-1-9 TiAlN Coatings Grown by HIPIMS
Grzegorz Greczynski, Jens Jensen, Lars Hultman (Linköping University, Sweden); Mats Johansson (Seco Tools AB Fagersta, Sweden); Christoph Schiffers (CemeCon AG, Germany) Ti1-xAlxN (0≤x≤1) films have been prepared in an industrial scale coating unit by high power pulsed magnetron sputtering (HiPIMS/HPPMS) using three different sets of target configurations. First, elemental targets were co-sputtered in a hybrid HIPIMS-DCMS set up with one target (Al or Ti) operated exclusively in HIPIMS mode and the other target ran in the conventional DC magnetron sputtering (DCMS) regime. Second, films were deposited from a Ti-Al gradient target operated in HIPIMS mode. The Al content in the co-sputtered coatings was controlled by adjusting the average power of Ti and Al cathodes. A significant overrepresentation of Al was found (as compared to films produced exclusively by DCMS at the same power settings). This can be interpreted in terms of element-specific loss of deposition rate during HIPIMS processing, since Ti exhibits higher degree of ionization than Al (at the same average power and pulsing frequency), and in consequence a larger fraction of the sputter-ejected material is back-attracted to the target. The tilt-angle dependent XRD studies revealed that in the case of Ti-DC/Al-HIPIMS target configuration, the resulting films retained single phase NaCl crystal structure up to x=0.62 and the first traces of the hexagonal phase were detected at x=0.645, close to the solubility limit of x=0.67. For the case of Al-DC/Ti-HIPIMS, the films contained hexagonal phase already at x=0.53, whereas coatings obtained from the gradient target constitute an intermediate case with the transition point at x=0.58. Common for all samples is the behavior of the interplanar distance d200 that shows first, a decrease with increasing Al content up to the critical concentration where the hexagonal phase was detected, and a plateau thereafter for further increasing molar fraction of Al. The results of nanoindentation hardness measurements are in good agreement with the evolution of the crystalline phase content indicated by XRD. Films grown from gradient target show relatively high compressive residual stresses ranging from -2 GPa up to -4 GPa. On contrary, Ti-DC/Al-HIPIMS samples are nearly stress-free and in the most interesting range of compositions (0.55≤x≤0.6) exhibit residual stresses between -0.4 GPa and 0.2 GPa. |
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4:30 PM |
F2-1-10 Titanium Aluminum Nitride Sputtered using HIPIMS Technology
Markus Lechthaler, Juergen Weichart, Oliver Gstoehl (OC Oerlikon Balzers AG, Liechtenstein) High Impact Power Impulse Magnetron Sputtering (HIPIMS) is a modern sputter technology with the potential to be industrially commercialized. Here, first results will be presented using this technology in an industrial-scaled Oerlikon Balzers deposition equipment which was modified and equipped with HIPIMS for R&D investigations. Within this study, a series of TiAlN coatings was deposited while applying a broad range of different deposition parameters. Basic films properties such as the deposition rate, the surface roughness, the hardness, the Young’s modulus, and the film stress were determined to obtain a first categorization of these coatings and to make a comparison to established deposition technologies. In addition, the coating composition, the morphology and the structure of coatings are evaluated using X-Ray Diffraction (XRD), Scanning Electron Microscopy (SEM) and Energy Dispersive X-ray spectroscopy (EDX) in dependence of the different deposition parameters. Finally, lifetime machining investigations such as drilling and milling tests were conducted in order to evaluate as well the coating performance as the wear behavior. Potential applications of HIPIMS will be further discussed. |