ICMCTF2010 Characterization: Linking Synthesis Properties and Microstructure Sessions

Click a Session Code to view its Abstracts
Session Code Start Session Name
F2- Monday, April 26, 2010 10:00 AM In Situ Characterization
F3- Monday, April 26, 2010 1:30 PM Application of Ion and Electron Microscopy
F1-1- Tuesday, April 27, 2010 8:00 AM Advances in Characterization of Coatings and Thin Films
F1-2- Tuesday, April 27, 2010 1:30 PM Advances in Characterization of Coatings and Thin Films
FP- Thursday, April 29, 2010 5:00 PM Symposium F Poster Session
Topics | Time Periods | Schedule Overview