AVS2019 Spectroscopic Ellipsometry Focus Topic Sessions

Click a Session Code to view its Abstracts
Session Code Start Session Name
EL+AS+EM+TF-WeM Wednesday, October 23, 2019 8:00 AM Optical Characterization of Thin Films and Nanostructures
EL+EM-WeA Wednesday, October 23, 2019 2:20 PM Spectroscopic Ellipsometry: Novel Applications and Theoretical Approaches
EL-ThA Thursday, October 24, 2019 5:00 PM Spectroscopic Ellipsometry Late New Session
EL-ThP Thursday, October 24, 2019 6:30 PM Spectroscopic Ellipsometry Focus Topic Poster Session
Abstract Book | Topics | Time Periods | Schedule Overview