AVS2014 FrM Sessions, Friday, November 14, 2014 8:20 AM

Abstract Timeline | Time Periods | Topics | Schedule Overview

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Session Code Topic Session Name
2D+EM+MS+NS-FrM 2D 2D Materials: Device Physics and ApplicationsĀ 
AP+AS+NS+SS-FrM AP Correlative Surface and Interface Analysis with APT
AS+MC+SS-FrM AS Practical Surface Analysis II
CS-FrM CS Conservation Studies of Modern Heritage Materials 3
EL+AS+BI+EM+SS-FrM EL Application of SE for the Characterization of Organic and Biological Materials
EM+EN-FrM EM Nitrides for LED and PV Device Applications
EM+NS+TF-FrM EM Transparent Electronics
PS1-FrM PS Plasma Sources
PS2-FrM PS Plasma Surface Interactions II
SP+AS+BI+EM+NS+SE+SS-FrM SP Probe-Sample Interactions and Emerging Instrument Formats
SS+EM-FrM SS Semiconductor Surfaces and Interfaces 2
TF+AS-FrM TF Thin Film Characterization
TR-FrM TR Applications of Novel Materials in Tribology
Abstract Timeline | Time Periods | Topics | Schedule Overview