AVS1998 ThA Sessions , Thursday, November 5, 1998 2:00 PM
Thursday Afternoon
Abstract Timeline | Time Periods | Topics | Schedule Overview
Click a Session Code to view its Abstracts
| Session Code | Topic | Session Name |
|---|---|---|
| AS-ThA | AS | SIMS - Depth Profiling and Molecular Surface Analysis |
| EM1-ThA | EM | Dielectrics |
| EM2-ThA | EM | Non-destructive Testing and In-situ Diagnostics |
| MI-ThA | MI | Structure & Magnetism of Surfaces & Interfaces |
| NS-ThA | NS | Nanoscale Manipulation and Chemical Modification |
| PC-ThA | PC | RGA Characteristics and Calibration |
| PS-ThA | PS | Diagnostics II |
| SE-ThA | SE | Seeded Supersonic Beam Epitaxial Growth |
| SS1-ThA | SS | Surface Diffusion |
| SS2-ThA | SS | Oxide Growth and Structure |
| TF-ThA | TF | Ex-situ Characterization of Thin Films |