SIMS2015 Tuesday Afternoon

Sessions | Time Periods | Topics | Schedule Overview

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Session Tuesday, September 15, 2015
2:00 PM 3:00 PM 4:00 PM
Comparing Polyatomic Ion Beams for Mass Spectrometric Imaging of Mouse Brain Tissue by ToF-SIMS
Molecular Mapping of Metabolic Variation within Human Breast Tumors
Drug Delivery Mapping in Cancer Cells using Subcellular Topological Markers and 3D-TOF-SIMS
3D ToF-SIMS Imaging of the Distribution of Drug Compounds in Mammalian and Bacterial Cells
ToF-SIMS Imaging Reveals Species Difference in Drug Uptake in the Small Intestine of Rodents
Alternative Pathways for Generating Breakthroughs in Biological SIMS Imaging
Biological Tissue Imaging using GCIBs and Dynamic Reactive Ionization
Visualizing Pharmaceutical and Metabolite Uptake in Cells with Label-free 3D Mass Spectrometry Imaging
High-Resolution Imaging of Dietary Lipids by the NanoSIMS and Complementary Techniques
Parallel Ion Electron Spectrometry (PIES): A New Multi-Technique Paradigm for High-Resolution High-Sensitivity Characterization based on integrated TEM-SIMS
Argon Clusters - a Novel Solution for XPS and UPS Surface Analysis
XPS/UPS Depth Profiling with Gas Cluster Ion Beam for Characterization of Interfaces in Thin Multilayer Organic Structures
XPS Depth Profiling of Organic Photodetectors with the Gas Cluster Ion Beam
Surface Chemical Properties of Fluorocarbon Blended Hydrogels for Controlled Drug Release Applications by X-ray Photoelectron Spectroscopy and Time of Flight Secondary Ion Mass Spectrometry
Validation of a Complementary ToF-SIMS and UHPLC-ESI-MS/MS Method to Study the Release of Polymer Additives from Pharmaceutical Packaging
Towards Accurate Depth Profiling of Nitrogen in Thin Gate Oxides Surrounding Three Dimensional FINFET Structures Using a Multidisciplinary Approach
Determination of Carbon Distributions in a Quenched and Partitioned Steel using Nanoscale Secondary Ion Mass Spectroscopy and Electron Backscatter Diffraction
Chemical Stability of Polymers Under Ar-GCIB and X-ray Irradiation
ToF-SIMS and Multivariate Analysis of Polydimethylsiloxane: study of gamma radiation induced surface modification of silicone breast implant
1.5D SIMS Methodology for Semiconductors Technology Development
Operating the CAMECA NanoSIMS 50L at Reduced Primary Beam Impact Energies for Depth Profile Applications
Mechanism of Oxygen-Induced Segregation of Surface Species during Sputtering
Low Temperature Plasma for Crater Edge Depth Profiling of Inorganic Multilayers
SIMS Measurement of Hydrogen Detection Limit: Comparison of Different SIMS Instrumentation
Creating Depth Profile Standards for Inorganic Materials Using Inkjet Deposition
Study of Alkali Ion Exchange in High-Level Nuclear Waste Glasses using Secondary Ion Mass Spectrometry
Resolve Diffused Species at Interface with 3D-SIMS
Sessions | Time Periods | Topics | Schedule Overview