SIMS2015 Thursday Afternoon
Sessions | Time Periods | Topics | Schedule Overview
Hover over a paper or session to view details.
Click a Session in the first column to view session papers.
| Session | Thursday, September 17, 2015 | ||||||||||
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| 2:00 PM | 3:00 PM | 4:00 PM | 5:00 PM | ||||||||
| DO1-ThA |
ToF-SIMS of Frozen Hydrated Hydrogels
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Comparison of Cs+, C60+ and Arn+ for ToF-SIMS Sputtering of PS-b-PMMA
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Direct Comparison of Argon Gas Cluster Ion Beams and C60 in Molecular Depth Profiling of Organic Thin Films
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Argon Cluster Sputtering – Effects of Angle of Incidence, Sample Temperature and Composition
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The Comparison of Matrix Effects Depending on the Combination of Polymers in a Sample for Depth Profiles Using Ar Cluster Ion Beams
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Molecular Depth Profiling with Strong Field Post-Ionization
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Additive Chemistry and Distributions in Photoresist Thin Films
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Depth Profiling and Composition Analysis of Polymer:Fullerene Blend Layers for Organic Photovoltaics
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Interdiffusion of Fullerene Derivative into Conjugated Polymer Matrix upon Solvent Vapor Annealing
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Structural Analysis of the Outermost Hair Surface using TOF-SIMS with GCIB Sputtering
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| IS1-ThA |
Understanding Hydration of Proteins by SALVI and Liquid ToF-SIMS
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Investigating Shewanella oneidensis Biofilm Matrix in a Microchannel by In Situ Liquid ToF-SIMS
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In Situ Chemical Imaging of Environmental Liquid Surfaces and Interfaces Using Microfluidics and Dynamic ToF-SIMS
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Glyoxal Aqueous Surface Chemistry by SALVI and Liquid ToF-SIMS
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In-Situ Molecular Monitoring at the Electrode-Electrolyte Interface Using ToF-SIMS
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Improving Molecular Ion Signal Intensity for Application of In Situ Liquid SIMS on Biology and Environmental Research
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In-situ Liquid SIMS Probing of the Solid-Electrolyte Interphase (SEI) in Lithium Ion Batteries
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Mn Dissolution and its Impacts on the Spinel Based Li-ion Batteries Degradation: a FIB TOF SIMS Study
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| NN1+ |
The Role of SIMS in Developing Innovative Nanocharacterization Approaches
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Nanoparticle Analysis in Biological Systems
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Characterization of Individual Free-standing Nano-objects by Cluster-SIMS in Transmission
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Characterization of Nanometric Inclusions via Nanoprojectile Impacts
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Revisiting Ion Sputtering of Inorganic Thin Films
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Temperature Dependent Cs+ Ion Yield Changes During Cesium Bombardment SIMS
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Angular Distribution of Molecules Sputtered by Gas Cluster Ion Beams and Implications for Secondary Neutral Mass Spectrometry
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High-mass Heterogeneous Cluster Formation by Ion Bombardment of Binary and Ternary Al/Cu/Au Alloys.
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Molecular Depth Profiles Simulation: A Transport & Reaction Approach
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