SIMS2015 Monday Afternoon

Sessions | Time Periods | Topics | Schedule Overview

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Session Monday, September 14, 2015
2:00 PM 3:00 PM 4:00 PM 5:00 PM
3D1+
3D Imaging ToF-SIMS for Biology – Are We Living the Dream?
3D Organic Structure Characterization by FIB-TOF Tomography
3D-SIMS Characterization of Dictyostelium Discoideum during Chemotaxis
A Picture Is Worth a Thousand Words: Optimization For ToF-SIMS Tissue Images
Mass Spectrometry Image Fusion: What Works and What Doesn’t
The Benefits and Pitfalls of Image Fusion
Combining XPS Atomic Concentration Data with a ToF-SIMS Chemical Image Map using Image and Data Fusion
Exploring New Sources of High Resolution Data for Image Fusion
CI1-MoA
Depth Profiling of Inorganic Thin Films Using Large Oxygen Gas Clusters
Sputtering with Large On+ Cluster Projectiles on Inorganic Surfaces
Current Prospects of Organic Analysis with Ar-GCIB SIMS, from Synthetic Polymers and Organic Devices toward Biological Materials
Molecular Cluster Emission in Sputtering of Amino Acids by Argon Gas-cluster Ions
Argon Cluster Total Sputter Yield: Quartz Crystal Microbalance Measurements and Semi-Empirical Predictive Model
Quantitative Studies of Matrix Effects in Massive Cluster Impact (MCI) Sputtering of Intact Lipid and Peptide Ions
Enhanced Ionisation Using Water-containing Cluster Ion Beams - A Fundamental Study
Comparative Study of Secondary Ion Emission from Organic Thin Film Bombarded with Water, Methanol and Methane Cluster Ions
Investigation of Surface-adsorbate Interaction of Surface-adsorbed (bio-) Molecules Using Desorption/Ionization Induced by Neutral Clusters
Applications Of Tof-Sims For Imaging And Depth Profiling Commercial Materials
FS1+
FIB ToF-SIMS Tomography of through Silicon vias for 3-D Integration
Demonstration of Crater Wall Imaging as a Useful Tool in Functional Materials Research
Comparison of Conventional Dual Beam SIMS Depth Profiling with FIB/SIMS Cross Section Analysis
Lithiation Mechanisms of Composite Silicon Electrodes Revealed by FIB-TOF-SIMS: A Novel Way for the Study of Local Chemistry and Structure Dynamics in Electrode Materials
Oxide Development of Thermally Grown Oxides in SOFC Interconnect Materials Studied by ToF-SIMS using Isotope and FIB Crater Wall Analysis
MD Simulations of Polymer Sputtering by Large Gas Clusters: Effects of Cluster Nature (Ar, CH4), incidence angle and sample molecular weight
Development of Ambient SIMS using MeV-energy ion probe
MeV Particles, Huge Impact, Soft Desorption
MeV SIMS – A New Method for the Characterization of Modern Paint Materials
Sessions | Time Periods | Topics | Schedule Overview