AVS 66 Session EW-TuL: Exhibitor Technology Spotlight Workshop II

In this presentation we will highlight the latest developments in surface analysis and materials analysis instrumentation from Thermo Fisher Scientific.

New electron optical concepts have been introduced, allowing for K-resolving lenses in Angle resolved Photoelectron Spectroscopy and Small Spot Momentum Spectroscopy and Microscopy. The brand new ASTRAIOS 150 is a consequently k-resolving hemispherical analyzer for cutting-edge ARPES with large acceptance angles at ultimate energy and k- (or angle) resolutions. For limiting the acceptance areas to µm-ranges or momentum microscopy applications k-resolving immersion lenses have to be used. The KREIOS 150 series demonstrates perfectly the applications to small and/or inhomogeneous samples.

On the detector field the 2D-CMOS detector has proven to be the perfect choice for ultimate resolution and highest linearity at significant time resolution. Especially for momentum microscopy the direct imaging spin detector DISpin allow for highest sensitivities and uncompromising energy and k-resolutions.

Switching gears, on the XPS field the above mentioned new analyzers also can make a significant contribution to small spot-XPS. On the other hand still a high power small spot monochromatic X-ray source is needed. Thus the µFOCUS 195 is presented for the first time, being a Al Ka and Ag La dual anode monochromator source is presented, with a spot diameter smaller than 10µm.

For higher information depth the µFOCUS 730 HE is presented, a Cr Ka monochromator source with a 100µm spot size for laboratory HAXPES and NAP-HAXPES.

In this spotlight session we will showcase the latest TOF-SIMS developments from IONTOF.

In 1969 Kratos, then AEI, shipped the first commercially available X-ray photoelectron spectrometer to Dr David Clark at the University of Durham. In this presentation we will outline the developments from the first ES-100 to the state-of-the-art AXIS Supra⁺ and have established Kratos Analytical as a leader in the design and manufacture of XPS instruments.

We will detail the development of the Aberration Compensated Input Lens (ACIL) in the early 1980’s. Importantly the nature of the ACIL provided the analyst with an easy to use microprobe-like capability, enabling exact correlation of classic spectroscopic analysis with XPS and physical images – the advent of spatially keyed spectroscopy. A further significant development came with the AXIS series of spectrometers which were the first to incorporate a magnetic immersion (snorkel) lens. The combination of magnetic and electrostatic lenses lead to much greater collection efficiency of photoelectrons when compared to previous instruments, providing a step-change in performance specifications.

Another Kratos innovation, launched in the late 1990’s, was the incorporation of the spherical mirror analyser (SMA) with the hemispherical analyser in the AXIS Ultra. The SMA allowed fast, high spatial resolution parallel imaging, where an image of the sample is projected onto a 2D detector. This technology is still used today and allows us to define 1um imaging spatial resolution.

There have been a number of other momentous advances including software, automation and accessories. Probably the most significant of these recent developments is the gas cluster ion source (GCIS). This accessory has allowed the successful depth profiling of organic polymers and inorganic samples with retention of chemistry throughout the profile.

It is hoped that in reviewing milestones in Kratos’ development of XPS over the previous 50 years we will trigger discussion on requirements for the technique in the next 50 years.

•The PHI Quantes, laboratory based, XPS/HAXPES instrument

•Some new analytical options for complete characterization of electronic band structures on the PHI VersaProbe

•New features for XPS data acquisition and data reduction.