AVS2014 Materials Characterization in the Semiconductor Industry Focus Topic Sessions

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Session Code Start Session Name
MC+AP+AS-MoM Monday, November 10, 2014 8:20 AM Characterization of 3D Structures, 2D films and Interconnects
MC+2D+AP+AS-MoA Monday, November 10, 2014 2:00 PM Characterization of III-Vs (2:00-3:20 pm)/Photovoltaics, EUV masks, etc. (3:40-4:40 pm)
MC-TuP Tuesday, November 11, 2014 6:30 PM Poster Session for all areas of Materials Characterization in the Semiconductor Industry
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