AVS2014 Materials Characterization in the Semiconductor Industry Focus Topic Sessions
Topics | Time Periods | Schedule Overview
Click a Session Code to view its Abstracts
| Session Code | Start | Session Name |
|---|---|---|
| MC+AP+AS-MoM | Monday, November 10, 2014 8:20 AM | Characterization of 3D Structures, 2D films and Interconnects |
| MC+2D+AP+AS-MoA | Monday, November 10, 2014 2:00 PM | Characterization of III-Vs (2:00-3:20 pm)/Photovoltaics, EUV masks, etc. (3:40-4:40 pm) |
| MC-TuP | Tuesday, November 11, 2014 6:30 PM | Poster Session for all areas of Materials Characterization in the Semiconductor Industry |