AVS2014 MoA Sessions , Monday, November 10, 2014 2:00 PM
Monday Afternoon
Abstract Timeline | Time Periods | Topics | Schedule Overview
Click a Session Code to view its Abstracts
Session Code | Topic | Session Name |
---|---|---|
2D+AS+EM+NS+SS-MoA | 2D | Dopants, Defects, and Interfaces in 2D MaterialsĀ |
AC+AS+MI+SA+SS-MoA | AC | Theoretical Modeling of f Electron Systems |
AS+BI+MC+SS-MoA | AS | The Liquid Interface & Depth Profiling and Sputtering with Cluster Ion Beams |
BI+AS+NS-MoA | BI | Bio/Nano Interfaces |
EM-MoA | EM | Nanoparticles for Electronic Materials |
EN+EM+MN+NS+TR-MoA | EN | Energy Harvesting with Nanostructures |
MC+2D+AP+AS-MoA | MC | Characterization of III-Vs (2:00-3:20 pm)/Photovoltaics, EUV masks, etc. (3:40-4:40 pm) |
MI-MoA | MI | Topological Insulators/Rashba Effect |
NS+EN-MoA | NS | Nanophotonics and PlasmonicsĀ |
PS-MoA | PS | Advanced FEOL/Gate Etching |
SA-MoA | SA | Synchrotron Studies of Processes in Energy Conversion, Electronic Devices and Other Materials II |
SE+PS+TF-MoA | SE | Pulsed Plasmas in Surface Engineering |
SS+EN-MoA | SS | Metals, Alloys and Oxides: Structure, Reactivity & Catalysis |
TF+PS-MoA | TF | ALD Surface Reactions and Precursors |
TF-MoA | TF | Self-Assembled Monolayers, Layer-by-Layer Assemblies, and Hydrophobic/Amphiphobic Thin Films |
VT-MoA | VT | Vacuum Measurement, Applications of UHV and Ultraclean Processes |