Exhibitor Technology Spotlight Session

Tuesday, November 11, 2014 4:00 PM in Room Hall ABC

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4:00 PM EW-TuA-6 What’s New in AFM for Nanoelectrical and Nanomechanical Characterization
Keith Jones (Oxford Instruments Asylum Research)
Oxford Instruments Asylum Research will present the latest AFM innovations for nanoelectrical characterization that provide new information that was inaccessible by previous techniques: • Scanning Microwave Impedance Microscopy (sMIM) for conductivity and permittivity mapping on insulators, semiconductors and conductors • Nanoscale time dependent dielectric breakdown (NanoTDDB) with the spatial resolution of an AFM tip • Dual Gain CAFM to measure current from 1 pA to 10 µA with sub-pA sensitivity on samples with widely varying conductivity We’ll also present an overview and the latest results of AFM mapping modes that calculate both the elastic and loss modulus: • AM-FM Viscoelastic Mapping Mode for quantitative nanomechanics with the resolution, ease of use and speed of tapping mode • Contact Resonance Viscoelastic Mapping Mode for quantitative nanomechanics on materials from 1 GPa to 100's Gpa