We report in situ variable-temperature scanning tunneling microscopy studies of graphene growth on Pd(111) during ethylene deposition at temperatures between 723 and 1023 K. We observe the formation of monolayer graphene islands, 200-2000 Å in size, bounded by Pd surface steps. Surprisingly, the topographic image contrast from graphene islands reverses with tunneling bias, suggestive of a semiconducting behavior. Scanning tunneling spectroscopy measurements confirm that the graphene islands are semiconducting, with a bandgap of 0.3±0.1 eV. Using density functional theory calculations, we attribute this phenomenon to the breaking of hexagonal symmetry due to a strong interaction between graphene and the nearly commensurate Pd substrate. Our findings suggest the possibility of preparing semiconducting graphene layers for future carbon-based nanoelectronic devices via direct deposition onto strongly interacting substrates.

By means of Scanning Tunneling Microscopy/Spectroscopy (STM/STS) we investigate the electronic and structural modulation of epitaxial graphene grown on Ru(0001). The difference in lattice parameter between graphene and Ru(0001) induces in the graphene overlayer a Moiré pattern with hexagonal order and a lateral periodicity of around 3nm. The bonding with the substrate occurs through the hybridization of C p-states with Ru d states. Photoelectron spectroscopy shows that the bonding between the graphene and the metallic substrate is not carbidic and the graphene is doped with electrons from the substrate [1].

The hybridization between the carbon and ruthenium atoms changes inside the unit cell [2]. Measuring dI/dV maps we observe inhomogeneities in the charge distribution, i.e., electron pockets, in some areas of the ripples. This inhomogeneity can be understood with the help of a tight-binding model which incorporates a periodic potential associated with the structural ripples that induces a shift of the electronic levels and a corresponding charge transfer from conduction to valence bands for some atoms and the opposite in the others [3].

The influence of the modulated electronic structure in the STM images is quite strong. Large differences in corrugation values were measured in the STM images taken exactly in the same spot and changing the bias voltage applied between tip and sample. A compilation of data measured with different tips and different samples show that the apparent corrugation of the Moiré superstructure is essentially constant (0.1 nm) in the interval from -3V to -1V and diminish as the voltage goes from -1V up to +2V (0.03 nm). For a bias voltage higher than +2.5V, the contrast of the Moiré is inverted. By means of STS we measured, spatially resolved, the surface unoccupied density of states. The dI/dV spectra show that the contrast inversion is due to the presence of a strong peak at 3V above the Fermi level in the lower areas of the Moiré structure.

These results demonstrate that the electronic effects in this system are strong enough to overcome the actual geometric corrugation of the graphene layer.

[1] F. J. Himpsel et al., Surf. Sci. Lett. 115, L159 (1982)

[2] A.B. Preobrajenski et al., Phys. Rev. B 78, 073401 (2008)

[3] A. L. Vázquez de Parga et al., Phys. Rev. Lett. 100, 05680 (2008)

Topography measurements show that the C-Rh interactions lead to distortions of the ideal, free-standing graphene, resulting into two sets of superstructures: one is characterized by a coincidence lattice expanded to (12×12)/(11×11), while the other is contracted to (11×11)/(10×10). The coexistence of several graphene superstructures on a transition metal substrate is in contrast to previous reports. Both superlattices exhibit remarkable coherence lengths, in excess of 1000 nm. However, high-resolution images allow us to precisely monitor the registry of the C atoms with respect to the underlying substrate, revealing that the atomic arrangements are subject to local distortions. Resonance transmission microscopy and spectroscopy, in combination to DFT calculations, were further used to obtain deeper insight into the altering environment at the graphene/Rh(111) interface. Our results show how variations of the local work function within the overlayer unit cell provide invaluable information on the electronic coupling between graphene and Rh(111) substrate.

[1] K.S. Novoselov et al., Nature 438, 197 (2005)

[2] J. Coraux et al., Nano Letters 8, 565 (2008)

We use scanning tunneling microscopy (STM), low-energy electron diffraction (LEED), and low-energy electron microscopy (LEEM) to study four different orientations of single-layer graphene sheets on Ir(111). The most-abundant orientation (R0) has been previously characterized in the literature [1]. While less prevalent than R0, the three additional structures can still occur as relatively large domains, tens of microns in spatial extent. We find that the four types of graphene differ simply in how the graphene sheets are oriented relative to the in-plane directions of the Ir lattice. That is, the four types of graphene are rotational variants, similar to the rotational variants of graphene on Pt(111) [2,3]. Using selective-area LEED, we find the graphene sheets in the other three variants to be rotated by approximately 14°, 18.5° and 30° (R30), respectively. The R30 structure is studied in detail with STM. Compared with the R0 structure, R30 has much less height corrugation. We propose atomic models for the new variants. The moiré structures can be classified using simple geometric rules involving the different periodic and quasiperiodic structural motifs. In addition, LEEM reveals that linear defects form in the graphene sheets during cooling from the synthesis temperature. STM shows that the defects are ridges where the graphene sheets locally delaminate as the Ir substrate contracts. We will describe the factors that control the relative abundance of the different variants.

[1] A. T. N'Diaye, J. Coraux, T. N. Plasa, C. Busse, and T. Michely, New J. Phys. 10, 16 (2008).

[2] T. A. Land, T. Michely, R. J. Behm, J. C. Hemminger, and G. Comsa, Surf. Sci. 264, 261 (1992).

[3] M. Sasaki, Y. Yamada, Y. Ogiwara, S. Yagyu, and S. Yamamoto, Phys. Rev. B 61, 15653 (2000).

We present a study of dielectric deposition on graphene and bulk graphite for nanoelectronic device applications. Recent studies have demonstrated that the chemically inert nature of the graphene surface presents challenges to uniform deposition of high quality dielectrics by conventional deposition techniques including ALD. These issues are compounded by the ultrathin nature of graphene, as any covalent bonding that disturbs the underlying graphene lattice is likely to induce scattering and degrade mobility.

In this study, Al, Hf and Si are deposited by electron beam evaporation and subsequently oxidized. We also examine deposition of dielectrics by reactive electron beam evaporation in the presence of a partial pressure of oxygen in the vacuum chamber. Chemical interactions with the substrate are analyzed by means of in-situ x-ray photoelectron spectroscopy (XPS) before and after oxidation. Any presence of carbide bonding (AlC, HfC, SiC) is likely to degrade mobility, and we examine the conditions under which carbide bonds are formed. The oxidized films are also characterized by ex-situ Raman spectroscopy, particularly with regard to the formation of D-band states that are indicative of damage to the graphene lattice during deposition or oxidation. Surface morphology of the deposited films is studied using atomic force microscopy (AFM), particularly with regard to uniformity as pertinent to thickness scaling.

This work is sponsored by the NRI SWAN center.

Graphene is the ideal material for many dream applications, such as single electron transistors, field emission sources [1], light through electrodes, clothing solar cells, terra hertz surface acoustic wave (SAW) filters, wall paper displays, UV light emitting diodes, atomic gas sensors, DNA or antigen wafers…etc. However, a practical method to fabricate meter-sized graphene is still beyond imagination. We made use the mechanism of diamond synthesis in liquid phase and produced graphene of several hundreds microns. Such graphene revealed silk-like tenderness with transparent folding lines. This promising process appears scalable for making device-sized graphene in the near future. This paper also presented many intriguing aspects related to the growth of large graphene. We also proposed a new hypothesis of graphene formation by the catalytic exfoliation of graphite in molten iron group alloys.