AVS2008 Wednesday Afternoon
Sessions | Time Periods | Topics | Schedule Overview
Hover over a paper or session to view details.
Click a Session in the first column to view session papers.
| Session | Wednesday, October 22, 2008 | ||
|---|---|---|---|
| 12:40 PM | |||
| EW-WeL |
Characterization and Optimization of Polyatomic Ions for XPS Depth Profiling of Organic Materials
|
State-Of-The-Art Software and Surface Analysis at Thermo Fisher Scientific
|
XPS Sputter Depth Profiling and Surface Cleaning with C60 Sputter Ion Beams
|