AVS2004 WeM Sessions , Wednesday, November 17, 2004 8:20 AM
Wednesday Morning
Abstract Timeline | Time Periods | Topics | Schedule Overview
Click a Session Code to view its Abstracts
| Session Code | Topic | Session Name |
|---|---|---|
| AS-WeM | AS | Chemometric Analysis of Spectral or Image Data; XPS/TOF-SIMS Applications |
| BI1-WeM | BI | Cell-Surface Interactions |
| BI2-WeM | BI | Oligo Nucleotide - Surface Interactions |
| MI-WeM | MI | Magnetic Nanostructures |
| MS-WeM | MS | Semiconductor Manufacturing Technologies for the 45nm Crisis |
| NS-WeM | NS | Nanoscale Patterning and Lithography |
| OF+EM-WeM | OF | Molecular and Organic Films and Devices - Electronics |
| PS1-WeM | PS | Plasma in Nanoscale Applications |
| PS2-WeM | PS | Plasma Sources |
| SS1-WeM | SS | Metal Oxides and Clusters I: Formation and Structure |
| SS2-WeM | SS | Semiconductor Surface and Interface Structure |
| TF-WeM | TF | Optical Thin Films |
| VT-WeM | VT | Contamination Control, Outgassing and Modeling |
| WL-WeM | WL | Science of Semiconductor White Light I |