AVS1999 Wednesday Morning
Sessions | Time Periods | Topics | Schedule Overview
Hover over a paper or session to view details.
Click a Session in the first column to view session papers.
| Session | Wednesday, October 27, 1999 | ||||||||||
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| 8:20 AM | 9:20 AM | 10:20 AM | 11:20 AM | ||||||||
| AS-WeM |
Monte Carlo Simulations for Tilted Electron Multipliers1
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Gaede-Langmuir Award Address: Early Development of Auger and ESCA Instrumention
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Consistent, Combined Quantitative AES and XPS Digital Data Bases - Convergence of Theory and Experiment
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Relationships between Parameters Describing Inelastic Electron Scattering in Solids
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Straightforward Methods for Accurate Estimation of Attenuation Length and Similar Quantities in XPS and AES
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Quantitative Auger Spectroscopy: Applications to Process Development and Qualification of Tungsten Silicide Films
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Naphthalocyanine Molecules onto Si(111)7x7 and Si(100)2x1: Modes of Adsorption and Effects of Oxygen Doping Investigated with XPS
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Technique for Production of Calibrated Metal Hydride Films
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The Role of SIMS for Interface Control in the MBE Growth of InGaSb/InAS Strained Layer Superlattices
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| BI-WeM |
Fabrication of Biologically Active Interfaces upon Self-Organization of Amphiphilic Polymers
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Reactions of Biological Cells to Nanostructures
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Engineering Cell Surface Chemistry
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Biocompatibility of Cardiac Cells on Silane-Modified Surfaces
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Biomaterials That Talk
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Biofunctionalization of Surfaces with Peptide Amphiphiles
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Plasma Copolymer Surfaces for Cell Culture
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Mechanical Properties of a Bone Marrow Cell-Knit Composite for Tissue Engineering: Evolution under Mechanical Load
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The Effect of Lipopolysaccharide Structure and Composition on Microbial Cell Adhesion
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| EM+ |
Homoepitaxy on AlSb(001): Novel Reconstructions and Their Implications for Nucleation and Growth
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A New Point Projection Microscope for the Holographic Imaging of Single Macromolecules
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Single Molecule Vibrational Spectroscopy with a Variable Temperature STM
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Characterization of Electronic Materials and Devices by Scanning Probe Microscopies
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Mapping Composition and Electrostatic Potential in Devices
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Failure Analysis of Sub 1/4-Micron Contacts by Means of TEM-EELS
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Applications of AFM/SCM in Imaging Implant Structures of Semiconductor Devices
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Capacitance Measurements on Gold Nanowires
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| MI+ |
Models of Spin-dependent Tunneling
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High Performance Demonstration of Magnetic Tunnel Junction Random Access Memory*
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Pinhole Decoration in Magnetic Tunnel Junctions
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Novel Hybrid Magnetoelectronic Device for Magnetic Field Sensing
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Andreev and Conduction Electron Spectroscopy of Interfacial Spin Transport
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Spin-Polarization of La2/3√sub 1/3MnO3
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Electrical Spin Injection into LED Heterostructures
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Electron Spin Interferometry
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| MS-WeM |
Low Open Area Endpoint Detection of Plasma Etching Processes
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Broad Band RF Based Sensing and Control of Reactive Ion Etching
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Diagnostic and Plasma Etch Endpoint Applications using Full Spectrum Optical Emission Spectroscopy
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Real Time Control of Plasma Deposited Optical Filters by Multiwavelength Ellipsometry
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Real Time and Run-to-Run Process Control of Plasma Processes Using Internal Machine and External Sensor Data
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Advanced Endpoint Capability in Plasma Processing Equipment Using Interferometer Technique
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Reaction Sensing in Multicomponent CVD Processes using an Acoustic Sensor
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Improvements in Wafer Temperature Measurements
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| NS-WeM |
"MILLIPEDE" - A Highly Parallel, Very Dense AFM-Based Data Storage System
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Scanning Probe Lithography of Silicon Nitride Thin Films
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Nanolithography and Pattern Transfer of (110)-oriented Silicon Using Scanning Probe Lithography and Anisotropic Wet Etching
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Patterning of Silicon Surfaces With a Non-Contact Atomic Force Microscope: Attomol Chemistry and Nanofabrication
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Fabrication of Nanoscale Metal Wires on the Si(001) Surface Using Scanning Tunneling Microscopy
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Growth and Characterisation of Submicrometer Regular Arrays of Pillars and Helices
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Plasma Polymerization as a Novel Means of Preparing Concentric-Tubular Composite Microstructures
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Fabrication of Bismuth Nanowires with a Silver Nanocrystal Shadowmask
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Fabrication of Metal Nano-wires using Carbon Nanotube Masks
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Strain Effects on the Growth Modes at Stepped Surfaces
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| PS-WeM |
The Ion-Assisted Etching and Profile Development of Silicon in Molecular and Atomic Chlorine
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Investigation through Simulation of the Effect of Ar Addition on the Cl+/Cl2+ Ratio in Chlorine Discharges
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Does Mask Charging Influence Sidewall Trench Formation ?
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Modeling Feature Evolution in Plasma Processes
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Feature Profile Evolution of SiO2 Trenches in Fluorocarbon Plasmas
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Application of an Integrated Feature Scale Model to Ionized PVD of Cu Barrier and Seed Processes
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Analysis and Simulation of Mask Erosion During Dry Etching
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Characterization of Photoresist Trimming in a Lam TCP9400 With the Aid of a Profile Simulation
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| SS1-WeM |
Temporal Diffraction: A New Method for Studying Surface Kinetics
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Similarities in Tensile and Compressive Strain Relief in Growth of Cu and Ag on Ru(0001)1
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Step-Step Interactions on TaC(910)1
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Phosphide Phases on Cu(001): a Helium Atom Scattering Study
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Ordered Alloying of Pd with the Mo(001) Surface
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Alkali-Metal-induced 3x1 Reconstruction of the Ge(111) Surface
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High-Resolution Structural Analysis of Te/Ge(001)
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A Novel STM Imaging Mechanism Used to Resolve the Atomic Structure of the As-Rich GaAs(001)-(2x4) Surface
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Dislocations, Phason Defects, and Domain Walls in a One-dimensional Quasiperiodic Superstructure of a Metallic Thin Film
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The Surface Reconstructions of InP(001)
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| SS2+ |
Trapping and Desorption of Energetic Cu Atoms on Cu(111) and (001)Surfaces at Grazing Incidence
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Dynamics of NO+ Abstraction of Oxygen on Al(111)
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Oxygen Negative Ion Emission from Al(100) Bombarded by Li+ Ions
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Matrix Dependent He+ Neutralization by Adsorbates: An ISS Study of S and Cl on TiO2(110)
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Hyperhhermal Ion - Surface Interactions
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Dissociation and Energy Distribution Processes in XY-(CO2)n (XY = ICl, I2, and Br2) Collision onto Silicon Surface
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Angle Resolved Measurements of Ions and Neutrals Scattered from HOPG Surfaces upon Hyperthermal Glancing Incidence Irradiation with Large Polyatomic Ions: Charge Changing and Impact Orientation Phenomena
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Surface Structure Determination by Angle-Resolved Mass Spectroscopy of Recoiled Ions
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Depth Information in Direct Recoiling Peak Shapes: Simulations from Model Surfaces
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Hyperthermal-energy Ion Scattering on Si(100)
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| SS3+ |
Spectroscopic Nonlinear Optical Responses of Clean, H-terminated and Ge-covered (2x1)Si(001)
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Si Surface Passivation: Si(111):GaSe versus Si(111):As
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Electron Excitations and Optical Properties of Semiconductor Surfaces
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Low Temperature Scanning Tunneling Microscopy and Spectroscopy of the √3x√3 R30° Phase of Sn/Si(111)
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Electronic Structure of the 3C-SiC(001)-c(4x2) Surface
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Photoemission Spectroscopy of Platinum Overlayers on Silicon Dioxide Films
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The Behavior of Metallic Quantum Well State Dispersions in the Cu/fccCo/Cu(100) System as a Function of Film Thickness
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Atomic and Electronic Structure of Ag/Ni(110) and Ni/Ag(100)
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Spin-Orbit-Split Surface States in Clean and Alkali-Metal-Covered W(110)1
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Resonant Auger Studies of Metallic Systems
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| TF+ |
Detection of Photons Using Thin Films in Semiconductor MEMS
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Sputtered Coatings for Microfluidic Applications
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A Novel Thin-Film Proton Exchange Membrane Fuel Cell for Microscale Energy Conversion
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Thin Films in MEMS and MOEMS
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Residual Stresses in MEMS Structures
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Investigation and Modeling of Electrical Resistance in Polysilicon Thermal Actuators
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| VM-WeM |
Microstructural and Surface Morphological Evolution at the Atomic Scale during the Growth of Polycrystalline TiN: a TEM, XRD, HT-STM, and Modeling Study
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High Refractive Index <100>-Textured Cubic Zirconia Formed in Nanolaminate Coatings Using Titania Interruption Layers
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Tribological Performance and Initial Finite Element Modeling of Reactively Sputtered Single and Multi-layer Chromium Nitride Thin Films
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Protective Coatings for Extreme Environments
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Interface Engineering in a Combined Arc/ UBM Deposition System during Growth of Ti0.5Al0.5N Films on Steel: Effects of Substrate Ion Etching
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Plasma Treatment of Polycarbonate for Improved Adhesion
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The Effects of Electron Beam Assistance on the Properties of Ion Beam Deposited CN Thin Films
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| VT-WeM |
Affect on Pumping-Speed Measurements Due to Variations of Test Dome Design Based on Monte-Carlo Analysis
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A Highly Simplified and Reliable Means of Regenerating Closed-Loop Gaseous Helium Cryopumps
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Review of Pumping by Thermal Molecular Pressure
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Inner Pressure Measurement of Turbo Molecular Pump
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Measurement of Axial Pressure Distribution on a Rotor of a Helical Grooved Molecular Drag Pump
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An MHD Plasma Vacuum Pump
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Stable Sputter Ion Pump Design
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Dry Vacuum Pumps for Semiconductor Processes - Guidelines for Primary Pump Selection
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