AVS1999 TuM Sessions , Tuesday, October 26, 1999 8:20 AM

Tuesday Morning

Abstract Timeline | Time Periods | Topics | Schedule Overview

Click a Session Code to view its Abstracts
Session Code Topic Session Name
AS-TuM AS Ion Beam Analysis and Depth Profiling
BI-TuM BI Protein Solid-Surface Interactions II
EM-TuM EM Si Surface Chemistry and Etching, Passivation, and Oxidation
FP-TuM FP Novel Materials for Field Emission Displays and Technologies for Flexible Displays
MI+VM+AS-TuM MI Magnetic Recording: Media
MS-TuM MS New Manufacturing Research Paradigms
NS1-TuM NS Nanomechanics
NS2-TuM NS Molecular Electronics
OE+EM+AS-TuM OE Interfaces and Characterization of Organic Thin Films
PS-TuM PS Plasma-Surface Interactions I
SS1+EM-TuM SS Nitrides and Compound Semiconductors
SS2-TuM SS Model Catalysts
TF-TuM TF Advanced Thin Film Formation Chemistry
VM+TF-TuM VM Ionized Plasma and Chemical Vapor Deposition
VT-TuM VT Total and Partial Pressure Gauging
Abstract Timeline | Time Periods | Topics | Schedule Overview