AVS1996 Monday Afternoon
Sessions | Time Periods | Topics | Schedule Overview
Hover over a paper or session to view details.
Click a Session in the first column to view session papers.
Session | Monday, October 14, 1996 | ||||||||||
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1:30 PM | 2:30 PM | 3:30 PM | 4:30 PM | ||||||||
AS-MoA |
Ion Beam Damage during Sputtering
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The Effects of Oxygen Flooding on Sputtering and Ionization Processes during Ion Bombardement
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Optimized TOF-SIMS Depth Profiling with a Dual Beam Technique
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Accurate Concentration Depth Profiling of Alkali Elements in Bulk Glasses by SIMS
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SIMS Analysis of Autodoping of Undoped Oxide in Chambers which Deposit Doped and Undoped Oxides
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Role of Desorption Methods on Quantitative Surface Analysis by Laser Postionization Mass Spectrometry
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AES Depth Profiling- Pitfalls and Work Arounds
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Auger Depth Profiling of Deeply Buried Thin Layers
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XPS Characterization of Semiconductor Thin Films using Simultaneous Mg/Zr Excitation
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BI-MoA |
Biomolecular Architectures at Solid Substrates
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Peptide-Antibody Recognition on Well Defined Surfaces Studied by Surface Plasmon Resonance
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Molecular Recognition at the Protein-Biomineral Interface
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Biological Characterisation of Materials
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Immobilization and Patterning of Functional Proteins on Surfaces
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Functionalized Self-assembled Films to Control Biological Responses
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Correlation of Culture Stratum Composition and Cell Properties of Three Cell Types Grown on SAMS by XPS
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Cysteine and Gly-Gly Adsorption and Desorption on Pt(111)
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EM-MoA |
High Resolution MEIS Characterization of Oxynitride Films on Si(100)
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X-ray Photoelectron Study of Nitrogen Incorporation into Silicon Dioxide Thin Films
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Nitrogen Incorporation at the Top Surface of Ultra-thin Gate Oxides by Low-temperature Plasma-assisted Processing
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Atomic Layer Controlled Al\sub 2\O\sub 3\ Films Grown on Si(100) Using Binary Reaction Sequence Chemistry
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SiO2/Si Interface Structures and Electrical Properties
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Ballistic Electron Emission Spectroscopy and Monte Carlo Simulations of Hot Electron Transport through MOS Structures
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Ballistic-Electron Emission Microscopy Characterization of Hot-Electron-Induced Trapped Charge in SiO\sub 2\
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Effect of Surface Roughness on 5 Nm Oxide Charge Trapping and Fowler-Nordheim Tunneling Behavior -- Experiment and 3D Simulation
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Evolution of Si/SiO\sub 2\ Interfacial Roughness during ECR Plasma Oxidation
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MI+ |
Magnetic Force Microscopy and Micromagnetics
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Direct Comparison of Magnetic Imaging using SEMPA and MFM
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Cross-Tie Walls on the Surface of Permalloy Films Studied by SEMPA
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A High-Resolution Photoemission Electron Microscope for Chemical and Magnetic Imaging, and Micro-Spectroscopy
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Quantitative Magnetic Force Microscopy on Ferromagnetic and Superconducting Materials
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Wrinkled Magnetization in Ultrathin Ferromagnetic Films
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Low Temperature Magnetic Force Microscopy of Vortices in YBa\sub 2\Cu\sub 3\O\sub 7\\sub -\\sub x\ Thin Films
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Magnetic Depth Profiling and Domain Imaging of Patterned Magnetic Films using Scanning Ion Microscopy with Polarization Analysis (SIMPA)
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MM+ |
Commercialization of MEMS
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Similarities and Differences Surface Micromachined MEMS and IC's
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Electrostatically Actuated Test Structures for MEMS Process Monitoring
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Out-of-Plane Microstructures using Stress Engineering of Thin Films
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Molding of High Aspect Ratio Microstructures
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Simulation of Rarefied Flows in MEMS Device
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MS-MoA |
Fault Detection and Process Control Projects at Sematech
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Fault Detection and Process Control under Development in the University Community - What is Possible in the Future?
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Experimental Study of RGA High Pressure Performance (II)
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Equipment and Process Fault Detection and Classification in PolySi RTCVD
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Stabilization of a Plasma-enhanced CVD Process using Quadrupole Mass Spectrometry
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Process Control and Diagnostics by Means of Self Excited Electron Resonance Spectroscopy (SEERS)
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Run by Run Uniformity Control on a Dual Coil Transformer Coupled Plasma Reactor with Full Wafer Interferometry
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An Artificial Neural Network EWMA Controller for Semiconductor Processes
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NS-MoA |
Near- and Far-Field Imaging Spectroscopies
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Scanning Near-field Optical Microscope for Single Molecule Imaging at Cryogenic Temperatures
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Super-Resolution Fluorescence Imaging of Single Dye Molecules in Thin Polymer Films and on Glass Surfaces
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Mie Scattering in Nanoscale Particles as Observed by Near-field Scanning Optical Microscopy (NSOM)
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Optical Fiber Structures Studied by a Tapping-mode Scanning Near-field Optical Microscope
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Polarization of Light Emitted from the STM Tunnel Junction
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Luminescence from GaAs(100) Excited by a Scanning Tunneling Microscope
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Selective Scanning Tunneling Microscope-Induced Photon Emission from Self-assembled Monolayer and Dye-coated Surfaces
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Near-field Optical Recording on Cyanine Dye Layer of a Commercial Compact Disk-recordable (CD-R)
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PS-MoA |
Mechanistic Studies of SiO\sub 2\ Etching Processes in an Inductively-Coupled High-Density Plasma Reactor
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Kinetics of Polymer Film Growth during Selective Oxide Etching in a Low-Pressure High-Density Plasma Reactor
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Fluorocarbon Species Measurement and Modeling for Low Pressure, High Density SiO\sub 2\ Plasma Etching
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Residence Time Effect on SiO\sub 2\/Si Selective Etching in High Density Fluorocarbon Plasma
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Investigation of Plasma Precursors in Selective HDP Etching
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Effects of the Magnetic Field on the Reduction of the Dielectric Window Damage Due to Capacitive Coupling in the Inductively Coupled Plasma
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CF\sub X\(X=1-3) Radical Densities during SiO\sub 2\, Si\sub 3\N\sub 4\ and Si Etching Employing ECR-CHF\sub 3\ Plasma
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Remote Plasma Etching of Silicon Nitride and Silicon Dioxide using NF\sub 3\/O\sub 2\ Gas Mixtures
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Electron and Ion Kinetics in SiF\sub 4\
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SS+ |
First Principles Predictions of Reaction Mechanisms on Si(100)-2x1
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Hyperthermal H Atom Interactions with D/Si(100)
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Effects of Impurities on Hydrogen Desorption from Si(100)
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The Effect of Foreign Adatoms on Silicon Surface Chemistry
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In Situ Studies of Growth and Reaction of Amorphous Silicon Hydride Films: Abstraction, Insertion and Etching by Atomic Deuterium
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Hydrogen Desorption from Ion-roughened Si(100)
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Mechanism in the Growth Related Photodecoposition of Disilane on Si(100)
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Diborane Reactions on Si(001) Investigated by Temperature Programmed Desorption
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SS2-MoA |
Giant Surface Friedel Oscillations: STM Study of Be(0001)
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Core Hole Decay Mechanisms in Ru Studied by Auger-Photoelectron Coincidence Spectroscopy
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Surface Plasmon Dispersion and Damping on Ag Surfaces Revisited with EELS-LEED
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Surface Investigations of an AlPdMn Quasicrystal and a Related Crystalline Alloy
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Synchrotron Radiation Photoemission from Photoionization to Electron Holography
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The Interfaces of Model Bimetallic Systems: A Core-level Photoemission Study
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A Symmetry Selective View of the Chemical Bonding of Organic Acids on Cu(110)
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Surface and Layer Electronic Structure of the Organic Superconductor \kappa\(BEDT-TTF)\sub 2\Cu[N(CN)\sub 2\]Br
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The Electronic Structure of Oxidised Aluminium Surfaces Studied by (e,2e) Spectroscopy
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TF-MoA |
Mechanical Properties of Thin Films and its Interface
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Atomistic Simulations of the Nanometer-scale Indentation of Thin Films
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Correlation of Film Stress and the Nano-Mechanical Properties of Au Thin Films
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Nanoindentation of Surfaces: Calculations of the Onset of Near-Surface Plasticity
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Mechanical Properties of Epitaxial Mo/NbN and W/NbN Superlattices
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Multilayer Film Deposition of TiN\sub X\/AlN\sub X\ on a Rotating Substrate from Reactive Sputtering of Elemental Targets of Titanium and Aluminum
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Formation and Optimization of Multiphase Film Properties of (Ti-Cr)N formed by Cathodic Arc Deposition
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Preparation and Characterization of Superhard CNx/ZrN Multilayers
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Optical Characterization of Carbon Nitride Thin Films Prepared by rf Sputtering
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TF+ |
Thin Film Challenges and Opportunities in the Development of Gas Microsensor Arrays
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Controlled Growth of WO\sub 3\ Gas Sensing Thin Films
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In Situ Resistance Characterization of Oxide Thin Film Growth Phenomena
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Reduced-Coordination Cation Sites at Surface Oxygen Vacancies on SnO\sub 2\(110)
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Interfacial and Electronic Properties of SiC-based Schottky Diode Gas Sensors Annealed at 425 C
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Characterization of the Resistance Change Produced by H\sub 2\, H\sub 2\S, CO, and O\sub 2\ Adsorption onto Iron Films
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Formate Adsorption on Epitaxial Cu(100) Films: Broadband Reflectance and dc Resistance
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VT-MoA |
Accurate Vacuum Measurements; How and Why
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Fabrication and Test of an Automatic Static Expansion System for Vacuum Gauge Calibration
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A Novel Primary Pressure Standard for Calibration in the mTorr Range
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Measurement Performance of Capacitance Diaphragm Gages and Alternative Low-pressure Transducers
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Cold-Cathode Gauges for Ultra-High Vacuum Measurements
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Linearization of the Spinning Rotor Gage Response for Pressures up to 100 Pa
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A Precision Gas Flowmeter for Vacuum Calibration
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International Comparison of Leak Standards using Calibrated Capillary Leaks
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Calibration of an Axial-symmetric Transmission Gauge in Ultrahigh and Extreme High Vacua
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