ICMCTF2015 Session CP: Symposium C Poster Session
Time Period ThP Sessions | Topic C Sessions | Time Periods | Topics | ICMCTF2015 Schedule
CP-1 Immobilization of Phthalocyanines on Nanocrystalline Diamond Surfaces for Photoelectrochemical Applications
Christo Petkov, Philipp Reintanz (University of Kassel, Germany); Miklos Veres, Laszlo Himics (Hungarian Academy of Sciences, Hungary); Rolf Merz, Michael Kopnarski (IFOS GmbH, Germany); Ulrich Siemeling, Johann Peter Reithmaier, Cyril Popov (University of Kassel, Germany) Diamond is a prospective electrode material for a number of applications providing efficient electron transport, high stability of electrolytic performance with time, a possibility for dye-sensitizing with photosensitive molecules, etc. It can be functionalized with electron-donor molecules, like phthalocyanines or porphyrins, for the development of light energy conversion systems. For effective attachment of such molecules, the diamond surface has to be modified by plasma- or photo-chemical processes in order to achieve the desired surface termination. In the present work we have investigated the immobilization of diverse phthalocyanines (Pc) on nanocrystalline diamond (NCD) surfaces with different terminations. The NCD films have been prepared by hot filament chemical vapor deposition (HFCVD) on silicon substrates and thereafter subjected to modification with O2 plasma for exchange of the H-termination of the as-grown surface. The effectiveness of the modification was studied by contact angle measurements and X-ray photoelectron spectroscopy (XPS). The as-grown and the modified NCD surfaces were exposed to phthalocyanines with different metal centers (Ti, Cu, Mn) or with different side chains. The results of the Pc grafting were characterized by XPS and Raman spectroscopy. XPS revealed the presence of the nitrogen stemming from Pc molecules and traces of the respective metal with ratios close to those in the applied Pc. As a next step the Raman spectra of Ti-Pc, Cu-Pc and Mn-Pc were obtained with two different excitation wavelengths (488 and 785 nm) from droplet samples on Si after evaporation of the solvent in order to establish their Raman fingerprints. The major differences in the spectra can be assigned to the effect of the size of the metal ion on the structure of the phthalocyanine ring. The obtained spectra were used as references for the Raman spectra of NCD surfaces grafted with Pc. |
CP-2 A High-quality SrTiO3 Nanocrystal Thin film prepared by Spin-coating method
XiaoHui Wang (Tsinghua University, China) Perovskite oxides have been extensively studied due to their widespread applications in electronics, sensing, catalysts, and energy storage. SrTiO3 is a typical perovskite-type oxide with good electronic performance, high photocatalytic activity and tunable chemical and physical properties. In this paper, we successfully synthesized sub-10 nm SrTiO3 nanocubes and their hyperstable nanocrystal sol via a rapid sol precipitation method under atmospheric pressure. The nanocubes are quite uniform with narrow size distribution, good crystallinity and high dispersibility, and are expected to be a better support for catalysts. In this method, controlled hydrolysis was veried to be critical to the formation of the regular cubic shape. The solvent TEG acted as an important additive in controlling the hydrolysis rate and providing steric repulsive energy for the stabilization of the nanocrystal sol. The high-concentration SrTiO3 nanocrystal sols (0.4–0.8 M) can be adapted to a variety of solution-based methods. They were successfully applied to fabricate high-quality SrTiO3 thin film at 100–160 oC. This method has many advantages including mild reaction conditions without high pressure, rapid formation (2 h) and well controlled size and morphology of the product, which can be applied to large-scale industrial production and open up new opportunities for low-cost fabrication of perovskite oxides. |
CP-4 High-k Polymer Nanocomposites as Gate Dielectrics for Organic Thin Film Transistor Applications
Yang-Yen Yu, Rih-Sheng Chiang, Su-Nu Liu, Wen-Chen Chien (Ming Chi University of Technology, Taiwan) We report on a systematic study of hydroxyl-containing polyimide (PI)-TiO2 nanoparticles (NPs) hybrid dielectric materials, to determine the effects of TIO2 NPs loadings (X) for X = 0, 2, 5, 8, 10, 13 and 15 wt%, on p-type pentacene organic thin film transistors (OTFTs). A condensation reaction to produce well-dispersed TIO2 NPs within the PI matrix was followed by spin coating to form a dielectric thin film directly on a silicon substrate. The thermal, optical, surface, dielectric, and electrical properties of the PI-TiO2 hybrid dielectric composite correlated to TiO2 content for each sample. The hybrid dielectric composites exhibit tunable insulating properties, including high dielectric constant, high capacitances, and low leakage current densities. Bottom-gate top-contact OTFTs fabricated using various PI-TiO2 hybrid dielectrics, exhibit low threshold voltages, moderately high field-effect mobility rates, and high ON/OFF ratios. This study opens a route towards transparent and highly stable hybrid dielectric materials with tunable dielectric properties, by careful selection of NPs and polymer matrix combinations. |
CP-7 AgNWs Embedded Transparent Conductive Oxide Films using a Facing Targets Sputtering Method
Sslimsearom You (Gachon University, Republic of Korea); You Seung Rim (University of California, Los Angeles, USA); KyungHwan Kim, HyungWook Choi (Gachon University, Republic of Korea) Recently, metal nanowires embedded transparent conductive oxide films have been attracting attentions for highly durable flexible technology. However, exposed surface of silver nanowires (AgNWs) could be easily oxidized at low temperatures in air, and the conductivity is decreased. Here, we report a sandwich structure of aluminum doped ZnO (AZO)/AgNWs/AZO via a sequential deposition method with the facing targets sputtering (FTS) and spin coating process for the passivation of AgNWs. FTS-based deposition technique has several advantages such as low damages and temperatures on substrate surface throughout the suppressing of high-energy particles bombardment during the deposition. We confirmed that top and bottom side of FTS-based AZO films could protect AgNWs without electrical degradation, which indicated that low temperature (<50 °C) and ion bombardments effectively suppressed the surface oxidation of AgNWs. Furthermore, high conformal contact between AZO film and AgNWs could also prevent to peel off AgNWs from the substrate. As a result, we successfully demonstrated that the sheet resistance and average transmittance in the visible range of this structure showed 24.1 Ω/sq., and over 80%, respectively. |
CP-8 Atomic Layer Deposited MgF2’s Optical, Mechanical and Chemical Properties and Potential use on Future Astronomical Satellite Mirrors
Christopher Moore (University of Colorado, Boulder, USA); John Hennessey, April Jewell, Shouleh Nikzad (NASA Jet Propulsion Laboratory, USA); Kevin France (Center for Astrophysics and Space Astronomy, USA) Optical thin films are a valuable component in optical systems and can determine the spectral band-pass of the system. Metal fluorides are known for their high transmittance from the ultraviolet (UV) to the infrared (IR). Magnesium Fluoride (MgF2) is one of the most commonly used metal fluorides, primarily as an anti-reflection coating for glass lenses for visible wavelengths and additionally as a protective overcoat to prevent oxidation of metallic mirrors. The latter use is important to the astronomical community, where metallic mirrors are commonly used to enable high efficiency optical systems for remote sensing of astronomical objects. Very thin layers of transmissive MgF2 may serve as an overcoat for aluminum to potentially provide high reflectivity from 90 – 2,000 nm. We are developing thin layers of MgF2 by Atomic Layer Deposition (ALD) to assess their potential use for future astronomical satellite missions. We present characterization of optical, mechanical and chemical properties of ALD MgF2 on silicon wafers. Results include measurements of reflectance from 90 – 800 nm, surface roughness, adhesion tests and etch rate tests. |
CP-9 Effects of Cu Layer Thickness on the Opto-electronic Properties of Multilayer AZO/Cu/AZO Films
Chien-Hsun Chu (National Cheng Kung University, Taiwan); Hung-Wei Wu (Kun Shan University, Taiwan); Jow-Lay Huang (National Cheng Kung University, Taiwan) In this study, we investigated the electrical, optical and structural properties of aluminum-doped ZnO (30 nm)/Copper (5-20 nm)/ aluminum-doped ZnO (30 nm) multilayer thin films on glass substrate deposited by rf and dc magnetron sputtering. The prepared AZO/Cu/AZO films were having the optimization of low resistivity of 6.72 × 10-6 Ω-cm, mobility of 10.45 cm2/V-s and carrier concentration of 6.152 × 1022 cm-3 at the Cu layer thickness of 20 nm. Maximum transmittance of 73.52 % at 610 nm wavelengths and Haacke figure of merit (FOM) are 1.16 × 10-3 Ω-1 (380-780 nm) of AZO/Cu/AZO films with the Cu layer thickness of 8 nm have been well demonstrated. These results indicate that the AZO/Cu/AZO films are a promising transparent conductive electrode scheme for various display applications. |
CP-10 Textured Surface Structures Formed Using Various Techniques on Transparent Conducting AZO Films Prepared by Magnetron Sputtering
Tadatsugu Minami, Toshihiro Miyata, Ryousuke Uozaki, Toshinori Yamanaka (Kanazawa Institute of Technology, Japan) For transparent electrode applications in thin-film solar cells, the textured surface structure formed on impurity-doped ZnO thin films must induce a significant scattering of incident visible and near-infrared light. This paper describes a comparative study of optical and electrical properties in surface-textured Al-doped ZnO (AZO) films formed by using various techniques. The transparent conductive AZO films were prepared on glass (OA-10) substrates by direct current magnetron sputtering (dc-MS) and radio frequency power superimposed dc-MS (rf+dc-MS). We used four surface texture formation techniques as follows: (a) formation by post-etching c-axis oriented AZO films deposited by MS, (b) formation during the crystal growth of AZO films deposited by MS under conditions suppressing c-axis orientation, (c) formation by post-etching the surface-textured AZO films grown in case (b), and (d) formation by post-etching the surface-textured AZO films resulting from the deposition of the case (b) AZO films onto the case (a) AZO films. In case (a), AZO films were prepared at a sputter Ar gas pressure of 0.6 Pa and a substrate temperature of 200oC. In case (b), surface-textured AZO films were first prepared at a sputter Ar gas pressure of 12 Pa and a substrate temperature of 350oC, and then the films were heat treated in a H2 gas atmosphere for 30 min. In case (d), low resistivity AZO films with a thickness of 1μm were first deposited under the same conditions used in case (a), and then surface-textured AZO films were deposited onto the case (a) AZO films. The textured surface structure formed by case (a) features relatively large etch pits (crater-like) with diameters in the range of 1-2μm, resulting from a wet-chemical etching (in a 0.1% HCl solution at 25oC). In case (b), the rough textured surface structure resulting on AZO films features wedge-shapes (pyramidal) with an average size below 1μm, which increased as the film thickness was increased up to 3.5μm. In case (c), the resulting structure features a double texture that combines the crater-like and pyramidal surfaces. However, it should be noted that both the surface-textured AZO films formed in cases (b) and (c) were found to exhibit low optical transmittance (or high absorption) near the band edge. Although the transmittance of the surface-textured AZO films was improved by decreasing the thickness, the resulting sheet resistance increased. The results of case (d) show that a double textured surface as well as a low sheet resistance could be achieved in surface-textured AZO films. |
CP-12 Improved Electro-optical Characteristics of Liquid Crystal Displays by rf-sputtering Deposited a-IGZO Thin Films
Gwomei Wu (Chang Gung University, Taiwan) Liquid crystal alignment is one of the core technologies for displays. The liquid crystal pretilt angle can determine device performance such as contrast, threshold voltage, and switching stability. The traditional rubbing technique for liquid crystal alignment has a lot of disadvantages such as debris and electrostatic discharge. Therefore, non-contact methods have been highly desired. In this report, a-IGZO thin films were deposited by radio-frequency sputtering on ITO glass as alternative alignment layers for liquid crystal display applications. A series of experiments have been carried out to reveal the physical characteristics, such as transmittance, crystalline microstructure and morphology. The sputtering process parameters were also optimized to improve the performance of these experimental cells, including V-T curve, contrast ratio, and response time, using twist nematic liquid crystal. The obtained pre-tilt angles are of 2o~85o corresponding to 40-150 nm a-IGZO films, with sputtering power of 50-70 W. The electro-optical characteristics showed promising results for alignment applications and would be presented and discussed. |
CP-17 Chemical Characterization and Optical Response of SixNy Films Deposited on Common Glass Substrate
Jose Edgar Alfonso, Manuel Pinzon, Jhon-Jairo Olaya-Florez (Universidad Nacional de Colombia, Colombia); Carlos Pineda-Vargas (Cape Peninsula University of Technology, South Africa); HenrySamir Vanegas (Universidad Nacional de Colombia, Colombia) Silicon nitride has been widely studied due to their physicochemical properties, which have allowed it to be used in applications such as mechanical components of motors, bearings and cutting tools; electronic: microelectronic devices and charge storage memories; and electro-optics: antireflective coatings of solar cells. The work reported in the literature shows that silicon nitride films are mainly deposited using the sputtering technique in reactive phase. In this work we have grown films of SixNy from a target with Si3N4 stoichiometry by RF magnetron sputtering technique on common glass substrates, with two mainly objectives: 1. to characterize the chemical composition based on the deposit parameters (electric power applied to the target, argon flow and substrate temperature), and 2. Relate the chemical composition with the optical response of the films. Stoichiometry of the phase composition and thickness measurements of the films were obtained by Rutherford Backscattering Spectroscopy (RBS), structural analysis was carried out through X-ray diffraction (XRD), morphological analysis was done through scanning electron microscopy (SEM), and the optical response was evaluated through transmittance measurements. The Swanepoel method was used to calculate the refractive index, thickness and absorption coefficient of the films. Additionally the energy band gap was determined using the Urbach's formula. |
CP-18 Effects of Ar, He, and Ne Gases on the Characteristics of SiH4+H2 ICP Plasma and the Resultant Properties of nc-Si:H Thin Films
Jang-Hsing Hsieh, Hsiu-Chi Lin (Ming Chi University of Technology, Taiwan); Chuan Li (National Yang Ming University, Taiwan) In this study, hydrogenated nanocrystalline silicon (nc-Si:H) films were prepared using ICP-CVD system attached with four internal U-shaped low inductance antennas. Ar, He, and Ne gases were introduced into SiH4/H2 plasma during deposition, with the variation of gas flow rate and SiH4/H2 ratios. During deposition, an OES (optical emission spectrometer) and a plasma probe were used to characterize the conditions of plasma. The crystalllinity, structure, and Si-H bonding of these Si:H films were investigated using Raman scattering spectroscopy, XRD, and FTIR. The correlations of plasma characteristics and thin film properties were studied. It is found that the crystallinity of nc-Si:H film increases with the introduction of Ar, He, and Ne gases, especially when Ar is added. The plasma density and IH* increase with the increase of the inert gases, most likely due to penning ionization effect. The deposition rate decreases with the inert gases. This might be caused by the enhancement of hydrogen etching. |
CP-19 Transparent Conducting Oxides for near IR Plasmonic Applications
Heungsoo Kim, Michael Osofsky, Nicholas Charipar, Alberto Pique (Naval Research Laboratory, USA) Noble metals such as gold and silver have been used traditionally as metallic components in plasmonic and metamaterial devices. However, conventional metals with high carrier concentrations are not suitable for near infrared (IR) plasmonic applications due to their relatively large optical losses, which are detrimental to the performance of plasmonic devices. Thus, it is necessary to develop less metallic materials (i.e., lower carrier concentrations) as an alternative for traditional metals in the near IR. Transparent conducting oxides (TCOs) have been recognized as low loss metallic components for plasmonic and metamaterials applications in the near IR. Through doping, the optical loses of these TCOs can be reduced over four times below what is achievable with conventional metals in the near IR. We have investigated various types of TCOs, such as Al-doped ZnO, Ga-doped ZnO, Sn-doped In2O3, and F-doped SnO2 using pulsed laser deposition. We will present details on the synthesis and optimization of these TCOs along with TCO-based plasmonic devices. This work was funded by the Office of Naval Research (ONR) through the Naval Research Laboratory Basic Research Program. |
CP-22 Comparison of Cu(InGa)Se2 Photovoltaic Absorbers Formed From Bilayer (InGa)2Se3/CuSe Precursor with Different Cu/III Ratio
Kyeongchan Moon, Alhammadi Salh, Hyeonwook Park, WooKyoung Kim (Yeungnam University, Republic of Korea) Chalcopyrite Cu(InGa)Se2 (CIGS) solar cells have been considered as the most promising thin film solar cell, recently reporting the highest cell efficiency of 20.8% (ZSW, 2013) using 3-stage co-evaporation process and 20.9% (Solar Frontier, 2014) using two-step metal sputtering followed by selenization while efficiency of multi-crystalline Si solar cells remained 20.4%. However, process time of both processes, i.e., 3-stage co-evaporation process and two-step metal sputtering followed by selenization, is known to be still too long. In this paper, it is proposed that the rapid reaction path starting from fast diffusion couples of (InGa)2Se3/CuSe, simulating NREL 3-stage process. Bilayer precursors were prepared by vacuum co-evaporation with different top CuSe thickness yielding different Cu/III ratios (0.5, 0.8 and 1.15). In-situ high-temperature X-ray diffraction analysis suggested the detailed phase transition of (InGa)2Se3/CuSe to (InGa)2Se3/CuSe2 at 220 deg.C, and then peritectic decomposition of CuSe2 to CuSe + liq. at 330 deg.C, which will be able to enhance liquid-assisted grain growth. Bilayer precursors were heat-treated in a rapid thermal annealing reactor with a Se vapor environment. The results showed that CIGS formation was completed within 3 min, with a fairly large and dense grain. Further detailed results of film (by XRD, SEM, TEM-EDS) and device characterization will be presented. In particular, careful compositional mapping and line profile by TEM-EDS were obtained. |
CP-23 Characteristics of Hybrid Electrodes Fabricated using Carbon Nanotubes and Metal Meshes for Flexible Touch Screen Panels
Bu-Jong Kim, Sang-Hoon Han, Jong-Seol Park, Jin-Seok Park (Hanyang University, Republic of Korea) Recently, the various transparent electrode (TE) materials, such as carbon nanotube (CNT), graphene, conductive polymer, and metal mesh, have been researched in order to replace the conventional indium-tin-oxide (ITO). Generally, in the case of electrode made of single material, there is a limited for replacement of ITO because of insufficiency properties of each material. For instance, CNTs have excellent visibility, chemical and mechanical stability, but they have a high sheet resistance because of a high contact resistance of the tube-tube junction. Metal meshes have some advantages such as lower sheet resistance and high transmittance, but they have the problem of low visibility due to high reflectance and oxidation. Conductive polymer materials reveal color problem and are sensitive to humidity. To overcome these problems that those materials have, hybrid-type TEs have attracted much interest. For instance, hybrid electrodes composed of aluminum-zinc-oxide (AZO) and multi-walled CNTs (MWNTs) were fabricated, which led to the reduction in sheet resistance. Graphene-silver nanowire hybrid electrodes were prepared via self-assembly method, which provided highly controllable transmittance and surface electrical resistance. Also, our group fabricated hybrid-type TEs using PEDOT:PSS-coated CNTs and characterized their electrical, optical, and color properties for touch screen panels. In this study, the hybrid-type electrodes have been fabricated by coating the CNTs on the metal meshes and their characteristics for the use of flexible TEs have been examined. The surface and cross-sectional morphologies were inspected using a field-emission scanning electron microscope (FE-SEM, SIGMA, Carl Zeiss). The electric sheet resistance was measured using a four-point probe (Chang Min Tech, CRT-SR-100), and the optical properties, such as transmittance, reflectance, and haze, were measured using a spectrum colorimeter (Konica Minolta, CM-5). Also, flexibility inspection (bending tester, JUNIL TECH, JIBT-200) was performed for a total of 30,000 times with a 12 mm bending radius and a 40 mm/s bending speed at normal temperature and pressure. Stability test was also conducted by measuring the sheet resistance variations of the manufactured hybrid TEs for a long period of 250 h under the conditions of the temperature of 85 °C and the humidity of 85 %. All the measured results were analyzed as functions of the fabrication conditions. The results obtained in this study confirmed that the fabricated CNTs/metal mesh hybrid electrodes possessed desirable properties as flexible TEs for touch screen panels. |
CP-24 Characterization of CdS Thin Films Grown on Cu(InGa)Se2 by Chemical Bath Deposition using Three Different Cadmium Salts
Salh Alhammadi, Kyeongchan Moon, Hyeonwook Park, WooKyoung Kim (Yeungnam University, Republic of Korea) Thin CdS layer is widely used as a buffer layer in various thin film solar cells including Cu(InGa)Se2 (CIGS), Cu2ZnSnS4 and CdTe. In this paper, the effect of cadmium salts on the properties CdS films deposited onto CIGS absorber utilizing chemical bath deposition (CBD) technique have been investigated. Three different types of cadmium salts (i.e., cadmium sulfate, cadmium chloride and cadmium acetate) have been explored for detailed comparison based on a series of thin film characterizations. Film growth rate was observed to be significantly varying with the cadmium source being used in CBD process. In all the cases, CdS films having a thickness of 70 nm were deposited on CIGS absorber for subsequent cell fabrication by adding i-ZnO/AZO transparent conducting oxides followed by current–voltage measurement. The microstructure of the films were also investigated by Atomic Force Microscopy (AFM), Scanning Electron Microscopy (SEM) and X- ray diffraction (XRD). |
CP-25 Fabrication and Optical Characterization of Titanium-Tungsten Mixed Oxide Thin Films
Mirella Vargas, Chintalapalle Ramana (University of Texas at El Paso, USA) Tungsten Oxide (WO3) films and low-dimensional structures have proven to be promising candidates in the fields of optics and electronics. WO3 is a well-established n-type semiconductor characterized by unique electrochromic behavior, an ideal optical band gap that permits transparency over a wide spectral range, and high chemical integrity. The plethora of diverse properties endow WO3 to be highly effective in applications related to electrochromism, gas sensing, and deriving economical energy. Compared to the bulk films, a materials system involving WO3 and a related species (elements or metal oxides) offer the opportunity to tailor the electrochromic response, and an overall enhancement of the physio-chemical and optical properties. In the present case, W-Ti- composite oxide films have been fabricated by co-sputtering titanium and tungsten metal targets employing DC sputtering. The films were grown at room temperature and based on the growth kinetics and sputtering behavior of the metals the sputtering power for Ti was kept constant at 50 W, and the W power was varied from 50 W to 150 W in order to obtain films with variable W-content. The behavior of the refractive index ‘n’ demonstrates an increase at λ<400 nm typical of the energy absorption across the bandgap. In the visible spectrum ‘n’ decreases with increasing W-power, however higher than 120 W the ‘n’ behavior increases. At λ>800 nm the ‘n’ behavior increases with increasing W-power. The extinction coefficient shows a similar trend, this optical behavior is attributed to additional photon absorption resulting from the increase in W-power which demonstrates a more metallic behavior in the optical data as well as in the physical appearance of the films. Correlating with band gap measurements, the band gap values for W-power less than 110 W are all above 3.0 eV as the power is increased to 150 W the band gap values decreased confirming a stronger metallic behavior of the films with increasing W-power. |
CP-26 Effects of Furnace-annealing and Hot-pressing on Properties of SZO Thin Films and Characteristics of SZO-TFTs
Sang-Hyuk Lee, Hyun-Sik Jun, Jin-Seok Park (Hanyang University, Republic of Korea) Silicon zinc oxide (SZO) thin films have been deposited by co-sputtering and the thin film transistors (TFTs) using the SZO film as the active layer have been fabricated with the bottom-gate configuration. Two kinds of post-treatment, such as furnace-annealing and hot-pressing, have been carried out on the deposited SZO films. The effects of post-treatment on the crystalline structure, chemical bond, surface roughness, and optical transmittance of the deposited SZO films have been analyzed as functions of the post-treatment conditions used. The electrical characteristics of the fabricated SZO-TFTs have also been measured and compared before and after the post-treatment being conducted. The on-off current ratio of the SZO-TFT has been improved by low-temperature (200 oC) furnace-annealing. The hot-pressing method would also be favorable in that the electrical characteristic of the SZO-TFT can be improved nearly similar to the case of carrying out the furnace annealing with the process time of about 60 min in spite of its short process time for about 30 s. |
CP-27 Coating of Conductive Polymers via Electropolymerization on Carbon Nanotubes and Characterization for their use as Flexible Electrodes
Jong-Seol Park, Bu-Jong Kim, Sang-Hoon Han, Jin-Seok Park (Hanyang University, Republic of Korea) Carbon nanotubes (CNTs) are considered as an ideal candidate for use in flexible electrodes due to their unique properties such as chemical stability, thermal conductivity, mechanical strength, and flexibility. For the application of CNTs to flexible electrodes, however, they still have problems which should be overcome been limited of application for flexible transparent electrode. One of them is the relatively high contact resistance caused by tube-tube junctions in CNTs. To improve the electric characteristics of CNTs, various types of hybrid electrodes have been studied. It has been reported that the electric characteristics of CNTs, with which the conductive polymer is mixed, can be improved as the conductive polymer plays a role in decreasing the contact resistance of tube-tube junction. However, the conductive polymer material is generally known to be tinged with blue. Also, the properties of polymer-CNTs electrodes may be sensitive to the methods and conditions used for the preparation of the polymer materials. Furthermore, the coating of polymer films on CNTs may decrease the transmittance and visibility of the electrodes. In this study, we present a novel process for fabricating hybrid-type electrodes and their characteristics as flexible transparent electrodes for touch screen panels. The hybrid electrodes were fabricated by spary-coating CNTs on polyethylene terephthalate (PET) substrates and then coating the CNTs with PEDOT(poly(3,4-ethylenedioxythiophene)-poly(styrenesulfonate)):PSS films via electropolymerization. For the fabricated hybrid electrodes, their surface and cross-sectional morphologies (via field-emission scanning electron microscopy and tunneling electron microscopy), electric sheet resistance (using the 4-point probe technique), visible-light transmittance (via UV-Vis spectroscopy), color properties (using a spectrum colorimeter), and flexibilities (via bending tests) were characterized as functions of the electropolymerization conditions used in coating the polymer films on CNTs. The experiment results confimed that the fabricated hybrid electrodes possessed the desirable properties in electric resistance, visible transmittance, and yellowness for flexible touch panels and they also revealed highly reliable characteristics under the bending conditions. |
CP-28 Deposition and Characterization of Hafnium-aluminum-zinc-oxide Films for their use as Channel Layers of Thin Film Transistors
Sang-Hyuk Lee, Won Kim, Kyeong-Woong Cha, Jin-Seok Park (Hanyang University, Republic of Korea) Recently, many zinc-oxide based thin-film transistors (ZnO-TFTs) have shown specific characteristics for transparent displays. M ost of the successful ZnO-based TFTs incorporate indium (In) such as indium zinc oxide (IZO), indium hafnium zinc oxide (IHZO), and indium gallium zinc oxide (IGZO). However, In is expensive and relatively rare on Earth. So recently, some researchers have reported experimental results which demonstrate new In-free or Ga-free oxide semiconductors, such as silicon-zinc-oxide (SZO), aluminum-zinc-oxide (AZO), and gallium-zinc-oxide (GZO). It is believed that aluminum (Al, group III) element acts as effective donors in the ZnO lattice. Because they may be substitutionally placed on Zn sites and will then enhance the carrier concentration and conductivity. Also, hafnium (Hf, group IV) is stable at high temperature stress and bias stress in ZnO lattice. Until now, however, there has been a scarcity of comprehensive studies on the hafnium-aluminum-zinc-oxide (HAZO) films and their applications for TFTs. In this study, HAZO films were deposited on glass and Si substrates via room-temperature co-sputtering where the electric power applied to the aluminum-zinc-oxide target was fixed and the electric power applied to the hafnium-oxide target was varied. Other conditions used to deposit the HAZO films were as follows: pressure of 10 mTorr, and gas flow rates of 60 sccm for Ar and 0.2 sccm for O2. The structural, optical, and electrical characteristics of HAZO films were evaluated using various methods, such as X-ray diffraction (XRD), atomic force microscope (AFM), X-ray photoelectron spectroscopy (XPS), energy dispersive x-ray spectroscopy (EDS), UV/visible spectrophotometer, and four-point probe. All the properties measured were characterized in terms of the deposition conditions of HAZO films. Moreover, TFTs using the HAZO films as the channel layer were fabricated and their device characteristics were characterized. The experimental results obtained in this study have confirmed that HAZO thin films have the potential for the channel layer of transparent TFTs. |
CP-29 Minimizing Damage from Negative Oxygen Ions on Structure of BaTiO3 Thin Film Deposited by Magnetron Sputtering Technique
Reji Thomas (INRS-EMT, Canada); Rafik Nouar (PLASMIONIQUE Inc, Canada); BrendaHiguera Valle, FabianAmbriz Vargas (INRS-EMT, Canada); Claude Côté, Sean Wolfe, Ryan Porter, Andranik Sarkissian (PLASMIONIQUE Inc, Canada); Andreas Ruediger (INRS-EMT, Canada) BaTiO3 is one of the most studied ferroelectric materials for its potential applications in electro-optical switching as well as piezoelectric actuation, among variety of other applications. However, few challenges, such as temperature stability and film growth rate should be overcome for widespread applications. BaTiO3 thin film grown by RF-magnetron sputtering often encountered re-sputtering due to the accelerated negative oxygen ions (O-), which could significantly alter the stoichiometry (micro-effect) of the deposit, and at higher power densities result in complete suppression of film growth (deposition rate = re-sputtering rate) and even substrate etching (deposition rate < re-sputtering rate). Using optical emission spectroscopy of depositing plasma, we have established an operation parameter range for the power density on the target, where the detrimental effects of negative ions (O-) could be minimized. For optimal power density range, we have also studied the role of oxygen- argon mixing ratio (0 to 100%) and operation pressure on structure of the deposited film using XRD and XPS characterization techniques. Study of the effects of deposition temperature on structure of thin film deposited on SrTiO3 (001) and platinized silicon substrates are in progress. Additionally, surface morphology, ferroelectric and dielectric properties of these films will also be studied and results will be presented. |
CP-31 Low Contact Resistance Carbon Film Modified Current Collectors for Electric Double Layer Supercapacitor
Kuo-Feng Chiu, Shi-Kung Chen, Hung-Jhih Leu, Shi-Nan Siao, Chung-Chun Hiao, Jing-Ting Liao (Feng Chia University, Taiwan) The carbon films have been synthesized by chemical vapor deposition (CVD) on AISI304 stainless steel (304SS) sheets with various C2H2/H2 flow ratios at 810oC. The films exhibit three different morphologies: filament (C25), sphere (C150) and transition types (C70) at different C2H2/H2 flow ratios, as characterized by scanning electron microscopy, X-ray diffraction and Raman spectroscopy. It was found that the degree of graphitization increases with decreasing C2H2/H2 flow ratios. Activated carbon and conductive carbon were plated on different types of carbon coated 304SS sheets and 304SS as the electrodes for electric double layer capacitor (EDLC). The electrochemical properties of these electrodes were investigated. The capacitance of the C70 electrode with the transition type carbon film current collector is 37.5 % higher than that of the electrode without carbon film in high current density (12 A/g). The results also indicate that the transition type carbon film efficiently improves the performances of high current density charge-discharge, which can be attributed to the reduction of contact resistance measured by electrochemical impedance spectroscopy. |
CP-32 Photocatalytic Ability Evaluation and Life Cycle Assessment of Environmentally Friendly TiO2 Thin Films
Yu-Jie Chang (University of Taipei, Taiwan); Jyh-Wei Lee (Ming Chi University of Technology, Taiwan); Wei-Ju Chen (University of Taiepi, Taiwan); Tzu-Yao Lin (Ming Chi University of Technology, Taiwan); Bih-Show Lou (Chang Gung University, Taiwan); Chen-Yu Chang (National Taitung Junior College, Taiwan) Recently, the climate change issue stimulates people to consider the environmental impacts of materials fabrication processes. There are only very few studies that have noticed the impacts of materials fabricated by different process and applied to various systems. In this work, two photocatalytic TiO2 thin films on pure Ti substrates fabricated by anodic oxidation (AO) and plasma electrolytic oxidation (PEO), respectively, were studied. Microstructures and crystalline phases of TiO2 nanotube (TNT) thin films by AO process and porous TiO2 thin films by PEO treatment were investigated. The water treatment ability of two different TiO2 thin films was evaluated by methylene blue (MB) degradation test. The MB photocatalytic degradation rate was measured and the photocatalytic reaction rate was calculated. Effects of processing parameters on the photocatalytic ability were further discussed. In addition, the environmental impact assessments of two TiO2 thin films were conducted by the life cycle assessment (LCA) method. Environmental impacts yielded from fabrication and application stages were integrated to assess the total impact under different assume conditions, or scenario. For the LCA method, the time and reaction surface area required for two different TiO2 thin films to degrade the MB concentration from 2×10-5 M to 2×10-6 M in 6 m3 water were estimated. Two scenarios, 90 and 9000 cm2 of TiO2 thin film area were set to treat MB in water. It was showed that the environmental impact of the TiO2 fabricated by AO were 300 times more than that fabricated by PEO during the fabrication stage; however, the relationship was opposed during the application stage. When the scenario of surface area changed from 90 to 9000 cm2, increases of environmental impact by 38% and 95% were found for PEO and AO fabrication processes, respectively. It can be concluded that the systematic LCA developed in this study provided a good alternative selection for an environmentally friendly water treat method. |
CP-33 Novel Perylene Dyes For Organic Field Effect Transistors
Melika Mostafanejad (Eastern Mediterranean University, Turkey); J.B. Bodapati (British University of Nicosia, Turkey); Huriye Icil (Eastern Mediterranean University, Turkey) The perylene dyes are excellent electron acceptors and the properties mainly depend on the substitution at multiple positions of the perylene chromophore2. The bay/core positions are much more effective in manipulating the electronic properties of these dyes. The possibility of substitution leading to bay-substituted perylene diimides and polyimides is another advantage to manipulate the thin-film properties of various perylene derivative materials. In this study, novel bay-substituted perylene diimides and perylene polyimides have been synthesized in high yields and characterized by UV-Vis, IR, Fluorescence Spectroscopy, NMR, DSC, TGA and CV measurements. The prevention of face-to-face π-π stacking in the designed bay-substituted perylene dyes gave enhanced solubility when compared to the imide-substituted perylene dyes2,3. This makes the thin-film studies easier to explore the potential of the synthesized perylene dyes in OFETs. Accordingly, we reported the thin-film studies in detail along with the electronic properties which were studied through CV and square wave measurements. Importantly, we also reported the optical properties in detail as they are potential candidates for constructing organic light-emitting field effect transistors. References: 1. J.B. Bodapati, H. Icil, Dyes Pigm. 2008, 79, 224. 2. E. Fron, G. Schweitzer, P. Osswald, F. Würthner, P. Marsal, D. Beljonne, K. Müllen, F.C.D. Schryver, M.V.D. Auweraer, Photochem. Photobiol. Sci., 2008, 7, 1509. 3. A.C. Grimsdale, K.L. Chan, R.E. Martin, P.G. Jokisz, A.B. Holmes, Chem Rev., 2009, 109, 897. |
CP-34 Thickness Dependent Structural, Morphological and Optical Behavior of Sputtered Nanostructured Titanium Thin Films
Jyoti Jaiswal, Samta Chauhan, Paritosh Dubey, Ramesh Chandra (Indian Institute of Technology Roorkee, India) In the present work, Titanium (Ti) thin films of thickness (~11-1650 nm) have been successfully deposited onto glass substrates at room temperature by direct current (DC) magnetron sputtering technique. Thickness was varied by regularly increasing the deposition time, keeping all the other deposition parameters constant. The effect of thickness on the films have been studied for their structural, morphological and optical properties using X-ray diffraction (XRD), Field emission scanning electron microscopy (FESEM), Transmission electron microscopy (TEM), Atomic force microscopy ( AFM) techniques and Variable angle spectroscopic ellipsometry (VASE). The most universal and reliable method of determining the optical constants of metal thin films is Ellipsometry. The XRD analysis exhibited hexagonal closed packed (hcp) crystalline structure with predominant (100) crystallite orientation and an additional (002) orientation particularly. The experimental results revealed a systematic grain growth with increasing film thickness, along with enhanced film crystallinity . The average particle size and surface roughness in the films varied with the film thickness. It has been observed that maximum near infrared absorption coefficient occurs in the film exhibiting large thickness (~1650 nm), which may be associated with more light interaction path. All the films exhibit optical properties with the laser wavelength depending strongly on the thickness of the film. Enhancement and manipulation of near infrared light absorption in titanium film is a significant issue for applications of titanium-based optoelectronic and advanced photonic devices. The results are far-reaching with particularly promising opportunities for Nd-YAG laser based applications also. |
CP-35 20 mA Bidirectional Current Switching Based on Highly Resistive Vanadium Dioxide Thin Film Using CO2 Laser
Jihoon Kim, Songhyun Jo, Kyongsoo Park (Pukyong National University, Korea); Bong-Jun Kim (Mobrik Co., Ltd., Korea); Yong Wook Lee (Pukyong National University, Korea) A vanadium dioxide (VO2) thin film shows a reversible phase transition (PT) between an insulating state and a metallic state, which is induced by temperature, pressure, light, and so forth. Electric field can also trigger the PT in a two-terminal device based on a VO2 thin film, showing the highly nonlinear current-voltage behavior. An optical stimulus facilitates the electric-field-induced PT and even triggers the PT. Here, by utilizing a 10.6mm CO2 laser as an optical stimulus, we demonstrated bidirectional current switching in a two-terminal planar device based on a highly resistive VO2 thin film. The bidirectional current switching implies that the device resistance is changed according to the switched state of the laser, that is, high or low device current flows with the laser switched on or off. Two-terminal devices based on VO2 films grown by pulsed laser deposition were fabricated through etching and metallization processes. To optically stimulate the VO2 film, the CO2 laser beam was focused with an aspheric lens, and the focused beam illuminated the film of the device. The bidirectional current switching of up to 20 mA was realized by switching on or off the CO2 laser illuminating the film. The transient responses of laser-triggered currents, which were obtained in a circuit composed of a standard resistor, a DC voltage source, and the VO2 device, were analyzed when periodical laser pulses activated the device at various pulse widths and repetition rates. A switching contrast between off-state and on-state currents was measured as ~7067 with an off-state current of ~2.83 mA, and rising and falling times were measured as ~30 and ~16 ms, respectively, for 100 ms laser pulses. [Acknowledgments] This research was supported by Basic Science Research Program through the National Research Foundation of Korea(NRF) funded by the Ministry of Science, ICT and future Planning(2013R1A2A2A01068390). |
CP-37 High Temperature Oxidation of CrAlYN/CrY Thin Films and Adhesion Properties
Morteza Tahmasebian Myandoab, Ihsan Efeoglu, Kadri Ezirmik, Yasar Totik, Ersin Arslan, Hikmet Cicek (Atatürk University, Turkey) Reactive unbalanced magnetron sputtering technique was used to deposit CrAlYN/CrY multilayers thin films with various Al and Y contents on the high-speed steel. The coatings are exposed to elevated temperatures and then they are evaluated by scanning electron microscopy (SEM), energy dispersive spectroscopy (EDX) and X-ray diffraction (XRD). The scratch test technique is carried out to characterize coating adherence strength. Morphology, chemical composition, microstructure and adhesion behaviour of the coatings at elevated temperatures investigated with respect to deposition parameters. Coatings as deposited contain solid solution of AlN and Y in f.c.c CrN phase along with b.c.c CrY solid solution. By increasing temperature, coatings progressively denitrogenized and AlN phase separately is formed. In 600 oC, oxidation with composing CrO, CrO2 and CrO3 begins and at 800 oC, they are replaced with Cr2O3 however CrY phase still exist in the coating. Yttrium hinders the oxidation process with deposition in grain boundaries and slowing oxygen diffusion into coating.
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CP-38 Structural, Optical and Electrical Characteristics of BaSrTiOx Thin Films Deposited by RF Magnetron Sputtering
Turkan Bayrak, Ali Haider, ShahidAli Leghari, Cagla Ozgit-Akgun, Necmi Biyikli, Eda Goldenberg (Bilkent University, Turkey) ABO3-type perovskite oxides, where A and B denote two different cations, have recently attracted a great interest for their potentials in oxide-based electronics, because of their multifunctional opto-electronic properties including their high optical band gap and dielectric constants. Among several perovskite thin films BaSrTiO3 (BST) thin films are key elements for the development of high performance electronic devices, and their reliability and efficiency depend strongly on the precise knowledge of microstructure, as well as optical and electrical constants. Furthermore, the possibility of controlling the dielectric properties of BST thin films by optimization of the deposition conditions also brought new opportunities in emerging device applications. BST films have been deposited by chemical vapor deposition, sol-gel and sputtering techniques. Although numerous studies on BST thin films were reported in the recent years, the efforts mainly concentrated on the determination of a single physical property (i.e. either structural, optical, or electrical properties), and the correlation between multifunctional properties therefore remained unexplored. In the present work, we have deposited BaSrTiOx films with rf magnetron sputtering technique at room temperature on UV fused silica and Si substrates. The dependences of film microstructure, surface morphology, absorption edge, refractive index, and dielectric constants on deposition pressure, partial oxygen flow and the post-deposition annealing were examined by grazing-incidence X-ray diffraction (GIXRD), scanning electron microscopy (SEM), spectrophotometry, ellipsometry, as well as photoluminescence, capacitance-voltage and current-voltage measurements. Well-adhered, uniform and amorphous films were prepared at low deposition temperatures. For all as-deposited films, the average optical transmission was ~85% in the visible and near infrared spectrum. The refractive indices of BST films were in the range of 1.90-1.98 (λ = 550 nm) as a function of deposition conditions. Post-deposition annealing at 800 oC for 1 h considerably lowered the optical transmission, and the absorption edge shifted to VIS spectrum indicating lower optical band gap. Metal-insulator-semiconductor (Ag/BST/p-Si) diodes were fabricated and characterized by capacitance-voltage and current-voltage measurements. Initial results revealed that low-temperature-grown BST thin films have promising properties for device applications. |