ICMCTF2008 Advanced Characterization of Coatings & Thin Films Sessions

Click a Session Code to view its Abstracts

Topics | Time Periods | Schedule Overview

Session Code Start Session Name
F1-1- Monday, April 28, 2008 10:00 AM Advances in Characterization of Coatings and Thin Films
F1-2- Monday, April 28, 2008 1:30 PM Advances in Characterization of Coatings and Thin Films
F3/E5- Tuesday, April 29, 2008 8:00 AM Nanotribology Instrumentation and Diagnostics
F4- Wednesday, April 30, 2008 8:00 AM Applications of Analytical Electron Microscopy
FP- Thursday, May 1, 2008 5:00 PM Symposium F Poster Session
F2- Friday, May 2, 2008 8:00 AM In Situ Characterization
Topics | Time Periods | Schedule Overview