ICMCTF2007 Advances in Characterization of Coatings & Thin Films Sessions

Click a Session Code to view its Abstracts
Session Code Start Session Name
F1-1- Monday, April 23, 2007 10:00 AM Advanced Characterization / General Topics
F1-2- Monday, April 23, 2007 1:30 PM Advanced Characterization / General Topics
F4- Tuesday, April 24, 2007 8:00 AM Applications of Analytical Electron Microscopy
F3/E1- Tuesday, April 24, 2007 1:30 PM Nanotribology Instrumentation and Diagnostics
F2- Wednesday, April 25, 2007 1:30 PM In Situ Characterization
FP- Thursday, April 26, 2007 5:00 PM Symposium F Poster Session
Topics | Time Periods | Schedule Overview