AVS2017 Spectroscopic Ellipsometry Focus Topic Sessions

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Session Code Start Session Name
EL+AS+EM+TF-MoM Monday, October 30, 2017 8:20 AM Application of SE for the Characterization of Thin Films and Nanostructures
EL+AS+EM-MoA Monday, October 30, 2017 1:40 PM Spectroscopic Ellipsometry: Novel Applications and Theoretical Approaches
EL-TuP Tuesday, October 31, 2017 6:30 PM Spectroscopic Ellipsometry Poster Session
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