AVS2017 Spectroscopic Ellipsometry Focus Topic Sessions
Topic Abstract Book
(394KB, May 6, 2020)
Topics
| Time Periods
| Schedule Overview
Click a Session Code to view its Abstracts
| Session Code | Start | Session Name |
|---|---|---|
| EL+AS+EM+TF-MoM | Monday, October 30, 2017 8:20 AM | Application of SE for the Characterization of Thin Films and Nanostructures |
| EL+AS+EM-MoA | Monday, October 30, 2017 1:40 PM | Spectroscopic Ellipsometry: Novel Applications and Theoretical Approaches |
| EL-TuP | Tuesday, October 31, 2017 6:30 PM | Spectroscopic Ellipsometry Poster Session |