AVS2016 Spectroscopic Ellipsometry Focus Topic Sessions

Topics | Time Periods | Schedule Overview

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Session Code Start Session Name
EL+AS+BI+EM+TF-ThA Thursday, November 10, 2016 2:20 PM Optical Characterization of Nanostructures and Metamaterials (2:20-3:40 pm)/Application of Spectroscopic Ellipsometry for the Characterization of Thin Films (4:00-6:00 pm) and Biological Materials Interfaces
EL+AS+EM+TF-ThP Thursday, November 10, 2016 6:00 PM Spectroscopic Ellipsometry Poster Session
EL+AS+EM+MI+TF-FrM Friday, November 11, 2016 8:20 AM Spectroscopic Ellipsometry: Novel Applications and Theoretical Approaches
Topics | Time Periods | Schedule Overview