AVS2016 Spectroscopic Ellipsometry Focus Topic Sessions
Topics | Time Periods | Schedule Overview
Click a Session Code to view its Abstracts
| Session Code | Start | Session Name |
|---|---|---|
| EL+AS+BI+EM+TF-ThA | Thursday, November 10, 2016 2:20 PM | Optical Characterization of Nanostructures and Metamaterials (2:20-3:40 pm)/Application of Spectroscopic Ellipsometry for the Characterization of Thin Films (4:00-6:00 pm) and Biological Materials Interfaces |
| EL+AS+EM+TF-ThP | Thursday, November 10, 2016 6:00 PM | Spectroscopic Ellipsometry Poster Session |
| EL+AS+EM+MI+TF-FrM | Friday, November 11, 2016 8:20 AM | Spectroscopic Ellipsometry: Novel Applications and Theoretical Approaches |