AVS2010 Tuesday Afternoon
Sessions | Time Periods | Topics | Schedule Overview
Hover over a paper or session to view details. Click a Session in the first column to view session papers.
Session | Tuesday, October 19, 2010 | |||
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12:20 PM | ||||
EW-TuL |
A Multi-technique Approach to the Characterization of Patterned Polymers Using ESCALAB 250Xi
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A New Cluster Ion Beam for Depth Profiling Challenging Organic Materials
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Recent Developments in X-ray Photoelectron Spectroscopy Data Acquisition and Processing
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invet
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