AVS2000 WeM Sessions , Wednesday, October 4, 2000 8:20 AM
Wednesday Morning
Abstract Timeline | Time Periods | Topics | Schedule Overview
Click a Session Code to view its Abstracts
Session Code | Topic | Session Name |
---|---|---|
BI+SS-WeM | BI | Water at Biointerfaces |
DI+EL+MS-WeM | DI | Low K Dielectrics |
IE+PS+MS+SE-WeM | IE | Environmentally Friendly Process Development |
MC-WeM | MC | Methods of Data Analysis |
MI+EL-WeM | MI | Magnetic Semiconductors and Hybrid Structures I |
MM-WeM | MM | Microfabricated Sensors |
NS+NANO6+MC-WeM | NS | Nanomechanical and Interface Measurements |
OF+EL+SS-WeM | OF | Transport and Device Issues in Organic Thin Films |
PS+MS-WeM | PS | Plasma-Induced Damage |
SC+EL+SS-WeM | SC | Passivation and Etching of Semiconductors |
SS1-WeM | SS | Chemical Interactions and Surface Reactivity |
SS2-WeM | SS | Stimulated Surface Processes |
SS3-WeM | SS | Gas/Surface Dynamics |
TF-WeM | TF | Modeling of Thin Film Growth |
VT-WeM | VT | Sorption Processes and Leak Detection |