AVS2012 WeA Sessions , Wednesday, October 31, 2012 2:00 PM

Wednesday Afternoon

Abstract Timeline | Time Periods | Topics | Schedule Overview

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Session Code Topic Session Name
AS+NS+SS+TF-WeA AS 3D Imaging & Nanochemical Analysis - Part 2 (2:00-3:20 pm)/ Advanced Data Analysis and Instrument Control (4:00-6:00 pm)
BN+AS-WeA BN Bioimaging
EM+OX-WeA EM Oxides and Dielectrics for Novel Devices and Ultra-dense Memory
EN+TF-WeA EN Thin Films for Energy Applications
EW-WeA EW Exhibitor Technology Spotlight
GR+AS+EM+NS+SS-WeA GR Dopants and Defects in Graphene; Graphene Interfaces with Other Materials
HI+AS+NS-WeA HI Basics of Helium Ion Microscopy
LB+EM+GR+MN+TR-WeA LB Select Topics in Surface and Interface Science
MI+OX-WeA MI Spintronics, Magnetoelectrics, Multiferroics
NS-WeA NS Nanophotonics and Plasmonics
PS1-WeA PS Plasma Diagnostics, Sensors and Control 2
PS2-WeA PS Plasma Surface Interactions during PECVD and Plasma Surface Modification
SP+AS+BI+ET+MI+TF-WeA SP Emerging Instrument Formats
SS+EM-WeA SS Semiconductor Surfaces
SS-WeA SS Catalysis on Metals and Alloys
TC+EM+AS-WeA TC Printable and Flexible Electronics
TF+AS-WeA TF Thin Films: Growth and Characterization-I
TF+MI-WeA TF Thin Films for Memory and Data Storage
Abstract Timeline | Time Periods | Topics | Schedule Overview