AVS2010 WeM Sessions , Wednesday, October 20, 2010 8:00 AM
Wednesday Morning
Abstract Timeline | Time Periods | Topics | Schedule Overview
Click a Session Code to view its Abstracts
| Session Code | Topic | Session Name |
|---|---|---|
| AS-WeM | AS | New Ion Beam Technologies for Imaging, Sample Preparation and Analysis |
| BI1-WeM | BI | Biomolecules at Interfaces |
| BI2-WeM | BI | Proteins & Peptides on Surfaces |
| EN+NS-WeM | EN | Organic Photovoltaics |
| EN+TF-WeM | EN | CIGS, CZTS and Chalcopyrite Films & Solar Cells |
| EW-WeM | EW | Exhibitors & Manufacturers Technology Spotlight |
| GR+EM+MS+TF+MI-WeM | GR | Graphene and Carbon-based Devices |
| IS+AS+NS+MI-WeM | IS | In Situ Microscopy/Spectroscopy – In Situ Nanoscale Processes |
| NS+AS+MN-WeM | NS | Characterization and Imaging at Nanoscale |
| PS+MN-WeM | PS | Plasma Processing for 3D Integration, TSV, and MEMS |
| PS-WeM | PS | Plasma Surface Interactions (Fundamentals & Applications) I |
| SS1-WeM | SS | Oxide Surface Structure |
| SS2-WeM | SS | Electron, Photon and Ion Beam Induced Surface Modification |
| TF+EM-WeM | TF | High K Dielectrics for Si Electronics |
| TF+SE-WeM | TF | Glancing Angle Deposition (GLAD) I |
| TF-WeM | TF | ALD: Nanostructure, Magnetics and Biological Applications |
| TR+MN+NS+SS-WeM | TR | Influence of Atmosphere, Temperature, and Materials on Friction |
| VT-WeM | VT | Accelerators, Large Vacuum Systems, and Vacuum Surfaces |