AVS2000 WeM Sessions , Wednesday, October 4, 2000 8:20 AM

Wednesday Morning

Abstract Timeline | Time Periods | Topics | Schedule Overview

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Session Code Topic Session Name
BI+SS-WeM BI Water at Biointerfaces
DI+EL+MS-WeM DI Low K Dielectrics
IE+PS+MS+SE-WeM IE Environmentally Friendly Process Development
MC-WeM MC Methods of Data Analysis
MI+EL-WeM MI Magnetic Semiconductors and Hybrid Structures I
MM-WeM MM Microfabricated Sensors
NS+NANO6+MC-WeM NS Nanomechanical and Interface Measurements
OF+EL+SS-WeM OF Transport and Device Issues in Organic Thin Films
PS+MS-WeM PS Plasma-Induced Damage
SC+EL+SS-WeM SC Passivation and Etching of Semiconductors
SS1-WeM SS Chemical Interactions and Surface Reactivity
SS2-WeM SS Stimulated Surface Processes
SS3-WeM SS Gas/Surface Dynamics
TF-WeM TF Modeling of Thin Film Growth
VT-WeM VT Sorption Processes and Leak Detection
Abstract Timeline | Time Periods | Topics | Schedule Overview