Theory and Characterization of Thin Film Properties (TF-FrM)
Friday, Oct 25 2019 8:20AM, Room A216
Moderated by: Angel Yanguas-Gil, Argonne National Laboratory; Gerben van Straaten, Eindhoven University of Technology, The Netherlands
Abstracts (Use Expand/Collapse icon in first column to see/hide details)
SchedulePaper #Invited TalkTitle
8:20 AMTF-FrM-1Incorporation Mechanisms and Electronic Properties of Impurities in Wide-Band-Gap Semiconductors
9:00 AMTF-FrM-3Review and Demonstration of Feature Scale Simulations
9:20 AMTF-FrM-4Process Optimization in Atomic Layer Deposition Using Machine Learning
9:40 AMTF-FrM-5Electroless Deposition of Cobalt Metal on a Palladium Layer on an Amine-modified Surface
10:00 AMTF-FrM-6The Origins of Condensation-Driven Degradation of Hydrophobic Thin Films
10:20 AMTF-FrM-7Structural and Electrical Properties of Sputtered HEA Thin Films of CrFeCoNiCu and their Oxidation Studies
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