Characterization of Thin Film Processes and Properties (TF+AS+EL+PS+RA-ThA)
Thursday, Oct 24 2019 2:20PM, Room A216
Moderated by: Richard Vanfleet, Brigham Young University; Virginia Wheeler, U.S. Naval Research Laboratory
Abstracts (Use Expand/Collapse icon in first column to see/hide details)
SchedulePaper #Invited TalkTitle
2:20 PMTF+AS+EL+PS+RA-ThA-1Phase Separation in III-V Semiconductor Thin Films
3:00 PMTF+AS+EL+PS+RA-ThA-3In-Situ Spectroscopic Monitoring of Methylamine-Induced Hybrid Perovskite Phase Transitions
3:20 PMTF+AS+EL+PS+RA-ThA-4Angle-Resolved HAXPES Analysis of AlxOy and CuxOy Layers formed by Metal Salt Diffusion into a poly 2-vinylpyridine (P2vP) Polymer Layer
4:00 PMTF+AS+EL+PS+RA-ThA-6Obtaining Smooth Surfaces and Measuring Surface Roughness
4:40 PMTF+AS+EL+PS+RA-ThA-8Characterizing Ultra-thin Layer Growth and Area Selective Deposition using High Resolution Low Energy Ion Scattering (LEIS)
5:00 PMTF+AS+EL+PS+RA-ThA-9Real-Time Monitoring of Aluminum Oxidation Through Wide Band Gap MgF2 Layers for Protection of Space Mirrors
5:20 PMTF+AS+EL+PS+RA-ThA-10Visualization of Ultrafast Charge Motion in Thin Films via THz Emission Spectroscopy
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