SPM for Functional Characterization (NS-ThA)
Thursday, Oct 24 2019 2:20PM, Room B131
Moderated by: Volker Rose, Argonne National Laboratory; Renu Sharma, National Institute of Standards and Technology (NIST)
Abstracts (Use Expand/Collapse icon in first column to see/hide details)
SchedulePaper #Invited TalkTitle
2:20 PMNS-ThA-1Interatomic Force Laws That Evade Dynamic Measurement
3:00 PMNS-ThA-3Intermittent Contact Resonance Atomic Force Microscopy (icr-Afm) for Nanoscale Mechanical Property Characterization
4:00 PMNS-ThA-6Novel Approaches Towards Cantilevers for Functional Multiparametric AFM Characterization
4:20 PMNS-ThA-7Fluid Handling using Scanning Probe Lithography for Nanocombinatorics
4:40 PMNS-ThA-8Accuracy of Tip-sample Interaction Measurements Using Dynamic Atomic Force Microscopy Techniques
5:00 PMNS-ThA-9Utilizing AFM to Study the Effect of Malaria-derived EVs on the Mechanical and Morphological Properties of Red Blood Cells
5:20 PMNS-ThA-10Silicon Oxide for RRAM Application: The SPM Analysis Approach
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