Advanced Ion Microscopy and Surface Analysis Applications (HI+AS+CA-WeA)
Wednesday, Oct 23 2019 2:20PM, Room B231-232
Moderated by: Richard Livengood, Intel Corporation, USA; Armin Gölzhäuser, Bielefeld University, Germany
Abstracts (Use Expand/Collapse icon in first column to see/hide details)
SchedulePaper #Invited TalkTitle
2:20 PMHI+AS+CA-WeA-1Analytical Capabilities on FIB Instruments using SIMS: Applications, Current Developments and Prospects
3:00 PMHI+AS+CA-WeA-3Correlated Materials Characterization via Multimodal Chemical Imaging using HIM-SIMS
3:20 PMHI+AS+CA-WeA-4Compositional Characterization of Biogenic Nanoparticles using the ORION NanoFab with SIMS
4:20 PMHI+AS+CA-WeA-7Effects of Ion Irradiation on Two-Dimensional Targets: What is Different from Bulk Materials
5:00 PMHI+AS+CA-WeA-9Effects of He Ion Irradiation on Gold Nanoclusters: a Molecular Dynamics Study
5:20 PMHI+AS+CA-WeA-10Low Damage Imaging of Polymers with the Helium Ion Microscope
5:40 PMHI+AS+CA-WeA-11Imaging of Biological Cells with Helium-Ion Microscopy
6:00 PMHI+AS+CA-WeA-12Channeling in the Helium Ion Microscope
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