Nanostructures and Nanocharacterization of Electronic and Photonic Devices (EM+2D+AS+MI+MN+NS+TF-WeM)
Wednesday, Oct 23 2019 8:00AM, Room A210
Moderated by: Sang M. Han, University of New Mexico; Jason Kawasaki, University of Wisconsin - Madison
Abstracts (Use Expand/Collapse icon in first column to see/hide details)
SchedulePaper #Invited TalkTitle
8:00 AMEM+2D+AS+MI+MN+NS+TF-WeM-1Photonic Thermal Conduction in Semiconductor Nanowires
8:20 AMEM+2D+AS+MI+MN+NS+TF-WeM-2Electric Field-Induced Defect Migration and Dielectric Breakdown in ZnO Nanowires
8:40 AMEM+2D+AS+MI+MN+NS+TF-WeM-3Characterization of SiGe/Si Multilayer FIN Structures using X-Ray Diffraction Reciprocal Space Maps
9:00 AMEM+2D+AS+MI+MN+NS+TF-WeM-4Nanoscale Depth and Lithiation Dependence of V2O5 Band Structure by Cathodoluminescence Spectroscopy
9:20 AMEM+2D+AS+MI+MN+NS+TF-WeM-5Electron Microscopy of Quantum Materials: From Learning Physics to Atomic Manipulation
11:00 AMEM+2D+AS+MI+MN+NS+TF-WeM-10Hot Electron Emission from Waveguide Integrated Graphene
11:20 AMEM+2D+AS+MI+MN+NS+TF-WeM-11Imaging Candidate Nanoelectronic Materials with Photoemission Electron Microscopy (PEEM)
11:40 AMEM+2D+AS+MI+MN+NS+TF-WeM-12Comparison of Features for Au and Ir Adsorbed on the Ge (110) Surface
12:00 PMEM+2D+AS+MI+MN+NS+TF-WeM-13Reference Materials for Localization Microscopy
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