Advances in Depth Profiling, Imaging and Time-resolved Analysis (AS-ThM)
Thursday, Oct 24 2019 8:00AM, Room A211
Moderated by: Jeffrey Fenton, Medtronic; Carl A. Ventrice, Jr., SUNY Polytechnic Institute
Abstracts (Use Expand/Collapse icon in first column to see/hide details)
SchedulePaper #Invited TalkTitle
8:00 AMAS-ThM-1What Really Lies Beneath the AVS Surface? Depth Profiling Can Help Provide the Answer
8:40 AMAS-ThM-3TOF-SIMS Tandem MS Imaging of (Sub-)Monolayer Coatings for Device Processing
9:00 AMAS-ThM-4TOF-SIMS at the Edge
9:20 AMAS-ThM-5Variation of SIMS Secondary Ion Yield of Si and Mg Dopants in GaN Grown by MOCVD
9:40 AMAS-ThM-6Impact of the Molecular Weight on the Depth Profiling of Polymer Thin Films using Low Energy Cs+ Sputtering
11:00 AMAS-ThM-10Probing the Surface Structure of Au-Pt Core-Shell Nanoparticles
11:20 AMAS-ThM-11Correlating Multiple Data Streams for Valence State Identification in Transition Metal Oxide during XPS Depth Profiling
11:40 AMAS-ThM-12Using Atom Probe Tomography for Three-dimensional Visualization of Sb Segregation in InAs/InAsSb Superlattices
12:00 PMAS-ThM-13Multi-technique Surface Analysis of Graphenes
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