Operando Characterization Techniques for In situ Surface Analysis of Energy Devices (AS+CA+LS-WeA)
Wednesday, Oct 23 2019 2:20PM, Room A211
Moderated by: Svitlana Pylypenko, Colorado School of Mines
Abstracts (Use Expand/Collapse icon in first column to see/hide details)
SchedulePaper #Invited TalkTitle
2:20 PMAS+CA+LS-WeA-1Probing the Electronic Structure of Electrocatalysts and the Formation of Reaction Intermediates
3:00 PMAS+CA+LS-WeA-3Surface Characterization of Battery Electrode/Electrolyte Materials Using XPS and ToF-SIMS
3:20 PMAS+CA+LS-WeA-4In Operando Molecular Imaging of Microbes as an Electrode
4:20 PMAS+CA+LS-WeA-7Operando-XPS Investigation of Low-Volatile Liquids and Their Interfaces using Lab-Based Instruments
5:00 PMAS+CA+LS-WeA-9Decoupling Surface and Interface Evolution in Polymer Electrolyte Membrane Systems Through In Situ X-Ray Photoelectron Spectroscopy
5:20 PMAS+CA+LS-WeA-10Low Temperature Scanning Tunneling Microscopy and Spectroscopy of Semiconductor Nanowire Device Surfaces
5:40 PMAS+CA+LS-WeA-11Work-function Estimation and In situ Measurement of Photoemission Spectroscopy of CuFeO2 under Near Ambient Condition
6:00 PMAS+CA+LS-WeA-12In-situ X-ray Photoelectron Spectroscopic Study of III-V Semiconductor/H2O Interfaces under Light Illumination
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