2D Materials Characterization including Microscopy and Spectroscopy (2D+AS+MI+NS-TuM)
Tuesday, Oct 22 2019 8:00AM, Room A216
Moderated by: David Geohegan, Oak Ridge National Laboratory
Abstracts (Use Expand/Collapse icon in first column to see/hide details)
SchedulePaper #Invited TalkTitle
8:00 AM2D+AS+MI+NS-TuM-1Near-field Infrared Spectroscopy of Single Layer MnPS3
8:20 AM2D+AS+MI+NS-TuM-2Multi-parameter Analysis of Genesis and Evolution of Secondary Electrons produced in the Low Energy Regime
8:40 AM2D+AS+MI+NS-TuM-3Probing Point Defects, Folds and Interfaces in 2D Material Heterostructures using Scanning Transmission Electron Microscopy
9:20 AM2D+AS+MI+NS-TuM-5Low-Energy Electron Induced Disordering and Decomposition of Self-assembled Monolayers on Au(111)
9:40 AM2D+AS+MI+NS-TuM-6Continuous Silicene, Silicene Ribbons and Surface Reconstructions on h-MoSi2
11:00 AM2D+AS+MI+NS-TuM-10Epitaxial Growth and Characterization of Single-Orientation Single-Layer Transition Metal Dichalcogenides on Au(111)
11:20 AM2D+AS+MI+NS-TuM-11Surface Reactivity of MoS2 by ambient pressure X-ray Photoelectron Spectroscopy
11:40 AM2D+AS+MI+NS-TuM-12Surface Characterization of 2D Materials and their 3D Analogues using XPS
12:00 PM2D+AS+MI+NS-TuM-13Characterization of Catalytic Active Sites on the Surface of MoS2 2-D Materials
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