Spectroscopic Ellipsometry Focus Topic Poster Session (EL+AS+EM+MS+TF-ThP)
Thursday, Oct 21 2010 6:00PM, Room Southwest Exhibit Hall
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6:00 PMEL+AS+EM+MS+TF-ThP-1Temperature Dependence of the Dielectric Function of AlSb Measured by Spectroscopic Ellipsometry
6:00 PMEL+AS+EM+MS+TF-ThP-2Optical Properties and Humidity Effects on Thin Films of Micro Fibrillated Cellulose Studied by Spectroscopic Ellipsometry
6:00 PMEL+AS+EM+MS+TF-ThP-3Spectroscopic Ellipsometry and X-ray Photoelectron Spectroscopy of La2O3 Thin Films Deposited by Reactive Magnetron Sputtering
6:00 PMEL+AS+EM+MS+TF-ThP-4Analysis of Anomalous Film Growth when Yttrium Oxide Thin Films are Exposed to 7.2eV Light
6:00 PMEL+AS+EM+MS+TF-ThP-5In-Situ Spectroscopic Ellipsometry of Lithium Ion Intercalation in GLAD Three-Dimensional Nanostructured Thin Films
6:00 PMEL+AS+EM+MS+TF-ThP-6Multi Phase Model Generation of Reflection Anisotropy Spectra of Copper Phthalocyanine Films on Vicinal Silicon Substrates
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