Forensics, Failure Analysis, and Practical Surface Analysis (AS2-ThM)
Thursday, Oct 21 2010 8:00AM, Room Cochiti A
Moderated by: Ian Gilmore, National Physical Laboratory, UK
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10:40 AMAS2-ThM-9Characterization of Composition C4 Explosives using Time-of-Flight Secondary Ion Mass Sepctrometry (ToF-SIMS) and X-Ray Photoelectron Spectroscopy (XPS)
11:20 AMAS2-ThM-11Chemical Speciation of Engineered Nanoparticle Surface Chemistry with Secondary Ion Mass Spectrometry
11:40 AMAS2-ThM-12Complementary XPS and SEM/EDS Characterization of Gunshot Residue (GSR)
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