Advanced Automation and Data Processing (AS1-ThM)
Thursday, Oct 21 2010 8:00AM, Room Cochiti
Moderated by: Vincent Smentkowski, GE Global Research Center
Abstracts (Use Expand/Collapse to see/hide details)
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8:20 AMAS1-ThM-2Chemical State Thin Film Characterisation by Angle Resolved XPS Using the Maximum Entropy Method
8:40 AMAS1-ThM-3Strategies for Multivariate Analysis of Very Large Spectral Images
9:20 AMAS1-ThM-5Report on the 59th IUVSTA Workshop: Surface Chemical Analysis – Improving Data Interpretation by Multivariate & Informatics Techniques
9:40 AMAS1-ThM-6Multivariate Analysis of NEXAFS Spectrum Images
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