Electron Spectroscopies (AS-TuM)
Tuesday, Oct 19 2010 8:00AM, Room Cochiti
Moderated by: Scott Bryan, Physical Electronics
Abstracts (Use Expand/Collapse to see/hide details)
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8:00 AMAS-TuM-1Recent Developments in Quantitative XPS and AES
8:40 AMAS-TuM-3Effect of Monochromator X-ray Bragg Reflection on Photoelectric Cross Section
9:00 AMAS-TuM-4Photovoltage, Photoconductivity and Charging Probed by Dynamical XPS Measurements
9:20 AMAS-TuM-5Order-Disorder Transition for Corrugated Au Layers
9:40 AMAS-TuM-6Surface Characterization of Gold Nanoparticles and Their Interaction with Protein G B1 Domain
10:40 AMAS-TuM-9Influence of Morphology and Processing on X-ray Photoelectron Spectroscopic Characterisation of SrO-CaO-ZnO-SiO2 Bioglass
11:00 AMAS-TuM-10Charging Compensation Method in XPS with Positive Voltage and Low Energy Electron Beam
11:20 AMAS-TuM-11Applications of Hard X-ray Photoelectron Spectroscopy for Characterization of a Hybrid Ti-Si Sol-Gel
11:40 AMAS-TuM-12Inline Production Monitoring of Carbon Doped Polysilicon Using X-Ray Photoelectron Spectroscopy
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